{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,25]],"date-time":"2026-02-25T17:57:19Z","timestamp":1772042239171,"version":"3.50.1"},"reference-count":8,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/test.2002.1041767","type":"proceedings-article","created":{"date-parts":[[2003,6,25]],"date-time":"2003-06-25T23:36:53Z","timestamp":1056584213000},"page":"250-259","source":"Crossref","is-referenced-by-count":68,"title":["Multiplets, models, and the search for meaning: improving per-test fault diagnosis"],"prefix":"10.1109","author":[{"given":"D.B.","family":"Lavo","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"I.","family":"Hartanto","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"T.","family":"Larrabee","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2001.966644"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2000.894213"},{"key":"ref6","author":"tornay","year":"1938","journal-title":"Ockham Studies and Selections Open Court Publishers"},{"key":"ref5","doi-asserted-by":"crossref","DOI":"10.1515\/9780691214696","author":"shafer","year":"1976","journal-title":"A Mathematical Theory of Evidence"},{"key":"ref8","first-page":"43","author":"nigh","year":"1997","journal-title":"Failure Analysis of Timing and 1 -only Failures from the SEMATECH Test Methods Experiment Proceedings of the International Test Conference"},{"key":"ref7","author":"bartenstein","year":"2001","journal-title":"SLAT Plus Work in Progress 2nd International IEEE Workshop on Yield Optimization and Test"},{"key":"ref2","author":"eichelberger","year":"1991","journal-title":"Structured Logic Testing"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/54.32421"}],"event":{"name":"2002 International Test Conference","location":"Baltimore, MD, USA","acronym":"TEST-02"},"container-title":["Proceedings. International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/8073\/22329\/01041767.pdf?arnumber=1041767","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,6,8]],"date-time":"2021-06-08T07:35:02Z","timestamp":1623137702000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1041767\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":8,"URL":"https:\/\/doi.org\/10.1109\/test.2002.1041767","relation":{},"subject":[]}}