{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,28]],"date-time":"2026-02-28T18:13:38Z","timestamp":1772302418837,"version":"3.50.1"},"reference-count":21,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/test.2002.1041773","type":"proceedings-article","created":{"date-parts":[[2003,6,25]],"date-time":"2003-06-25T23:36:53Z","timestamp":1056584213000},"page":"301-310","source":"Crossref","is-referenced-by-count":324,"title":["Embedded deterministic test for low cost manufacturing test"],"prefix":"10.1109","author":[{"given":"J.","family":"Rajski","sequence":"first","affiliation":[]},{"given":"J.","family":"Tyszer","sequence":"additional","affiliation":[]},{"given":"M.","family":"Kassab","sequence":"additional","affiliation":[]},{"given":"N.","family":"Mukherjee","sequence":"additional","affiliation":[]},{"given":"R.","family":"Thompson","sequence":"additional","affiliation":[]},{"family":"Kun-Han Tsai","sequence":"additional","affiliation":[]},{"given":"A.","family":"Hertwig","sequence":"additional","affiliation":[]},{"given":"N.","family":"Tamarapalli","sequence":"additional","affiliation":[]},{"given":"G.","family":"Mrugalski","sequence":"additional","affiliation":[]},{"given":"G.","family":"Eide","sequence":"additional","affiliation":[]},{"family":"Jun Qian","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"19","article-title":"Selective linear compactor of test responses with unknown values","author":"rajski","year":"0"},{"key":"17","article-title":"Test pattern compression for an integrated circuit test environment","author":"rajski","year":"2001"},{"key":"18","article-title":"Method for synthesizing linear finite state machines","author":"rajski","year":"2002"},{"key":"15","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.2000.843868"},{"key":"16","doi-asserted-by":"publisher","DOI":"10.1109\/43.875312"},{"key":"13","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2001.966711"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2001.966712"},{"key":"11","first-page":"237","article-title":"LFSR-coded test patterns for scan designs","author":"koenemann","year":"1991","journal-title":"Proc European Test Conference"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2001.990304"},{"key":"21","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2002.1011103"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2001.966671"},{"key":"20","doi-asserted-by":"publisher","DOI":"10.1109\/12.736428"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2000.894198"},{"key":"1","first-page":"151","article-title":"Test volume and application time reduction","author":"bayraktaroglu","year":"2001","journal-title":"Proc DAC"},{"key":"10","first-page":"748","article-title":"OPMISR: The foundation for compressed ATPG vectors","author":"keller","year":"2001","journal-title":"Proc ITC"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2001.966672"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1999.805650"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/12.364534"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.2000.843867"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1998.743186"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1999.766654"}],"event":{"name":"2002 International Test Conference","location":"Baltimore, MD, USA","acronym":"TEST-02"},"container-title":["Proceedings. International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/8073\/22329\/01041773.pdf?arnumber=1041773","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,13]],"date-time":"2017-03-13T22:19:46Z","timestamp":1489443586000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1041773\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":21,"URL":"https:\/\/doi.org\/10.1109\/test.2002.1041773","relation":{},"subject":[]}}