{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,19]],"date-time":"2025-03-19T11:22:34Z","timestamp":1742383354414,"version":"3.28.0"},"reference-count":22,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/test.2002.1041786","type":"proceedings-article","created":{"date-parts":[[2003,6,25]],"date-time":"2003-06-25T23:36:53Z","timestamp":1056584213000},"page":"407-416","source":"Crossref","is-referenced-by-count":6,"title":["Analysis of delay test effectiveness with a multiple-clock scheme"],"prefix":"10.1109","author":[{"family":"Jing-Jia Liou","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"L.-C.","family":"Wang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Kwang-Ting Cheng","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"J.","family":"Dworak","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"M.R.","family":"Mercer","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"R.","family":"Kapur","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"T.W.","family":"Williams","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"journal-title":"Eldo v4 4x User's Manual","year":"1996","key":"19"},{"journal-title":"Design compiler reference manual","year":"2000","key":"22"},{"key":"17","doi-asserted-by":"publisher","DOI":"10.1109\/EDTC.1994.326826"},{"key":"18","doi-asserted-by":"publisher","DOI":"10.1023\/A:1008266305694"},{"key":"15","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.1990.114949"},{"key":"16","doi-asserted-by":"publisher","DOI":"10.1109\/43.177406"},{"key":"13","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.2002.1012689"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.2002.1012652"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.2000.843832"},{"key":"12","first-page":"587","article-title":"Performance sensitivity analysis using statistical methods and its applications to delay testing","author":"liou","year":"2000","journal-title":"Proc Asian South Pacific Design Automation Conf"},{"key":"21","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4615-3158-6"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/43.62769"},{"key":"20","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.1985.1586020"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.2000.855293"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/2.803640"},{"key":"10","doi-asserted-by":"crossref","DOI":"10.1007\/978-1-4615-5597-1","author":"krstic?","year":"1998","journal-title":"Delay Fault Testing for VLSI Circuits"},{"key":"7","first-page":"117","article-title":"Statistical analysis of delay faults-theory and efficient computation","volume":"51","author":"antreich","year":"1997","journal-title":"AEU - International Journal of Electronics and Communications"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1023\/A:1008267608838"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/43.833205"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1998.670867"},{"key":"9","article-title":"New validation and test problems for high performance deep sub-micron VLSI Circuits","author":"breuer","year":"0","journal-title":"Tutorial Notes IEEE VLSI Test Symposium April 1997"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1999.805769"}],"event":{"name":"2002 International Test Conference","acronym":"TEST-02","location":"Baltimore, MD, USA"},"container-title":["Proceedings. International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/8073\/22329\/01041786.pdf?arnumber=1041786","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,15]],"date-time":"2017-06-15T22:43:43Z","timestamp":1497566623000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1041786\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":22,"URL":"https:\/\/doi.org\/10.1109\/test.2002.1041786","relation":{},"subject":[]}}