{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T15:19:55Z","timestamp":1725463195760},"reference-count":10,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/test.2002.1041793","type":"proceedings-article","created":{"date-parts":[[2003,6,25]],"date-time":"2003-06-25T23:36:53Z","timestamp":1056584213000},"page":"438-445","source":"Crossref","is-referenced-by-count":10,"title":["Multi-purpose digital test core utilizing programmable logic"],"prefix":"10.1109","author":[{"given":"J.S.","family":"Davis","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"D.C.","family":"Keezer","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"3","DOI":"10.1109\/TEST.1997.639599"},{"doi-asserted-by":"publisher","key":"2","DOI":"10.1109\/TEST.1998.743265"},{"doi-asserted-by":"publisher","key":"10","DOI":"10.1109\/TEST.1998.743156"},{"year":"1999","journal-title":"Design & Test","key":"1"},{"doi-asserted-by":"publisher","key":"7","DOI":"10.1109\/TEST.1993.470677"},{"doi-asserted-by":"publisher","key":"6","DOI":"10.1109\/VTEST.1994.292288"},{"doi-asserted-by":"publisher","key":"5","DOI":"10.1109\/TEST.1998.743140"},{"doi-asserted-by":"publisher","key":"4","DOI":"10.1109\/TEST.2001.966741"},{"doi-asserted-by":"publisher","key":"9","DOI":"10.1109\/TEST.1999.805811"},{"key":"8","first-page":"814","author":"tummala","year":"1996","journal-title":"\"Microelectronics Packaging Handbook \" Second Edition Part II Chapter 13"}],"event":{"acronym":"TEST-02","name":"2002 International Test Conference","location":"Baltimore, MD, USA"},"container-title":["Proceedings. International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/8073\/22329\/01041793.pdf?arnumber=1041793","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,13]],"date-time":"2017-03-13T21:55:01Z","timestamp":1489442101000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1041793\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/test.2002.1041793","relation":{},"subject":[]}}