{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,7]],"date-time":"2026-01-07T07:48:52Z","timestamp":1767772132590,"version":"3.28.0"},"reference-count":13,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/test.2002.1041810","type":"proceedings-article","created":{"date-parts":[[2003,6,25]],"date-time":"2003-06-25T23:36:53Z","timestamp":1056584213000},"page":"590-598","source":"Crossref","is-referenced-by-count":184,"title":["FRITS - a microprocessor functional BIST method"],"prefix":"10.1109","author":[{"given":"P.","family":"Parvathala","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"K.","family":"Maneparambil","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"W.","family":"Lindsay","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"13","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1997.600334"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.1999.781304"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2000.894231"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2001.966677"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1145\/62882.62924"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1997.639630"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1998.743296"},{"key":"7","first-page":"204","article-title":"Embedded-software-based approach to testing crosstalk-induced faults at on-chip buses","author":"lai","year":"0","journal-title":"VLSI Test Symposium 19th IEEE Proceedings of VTS 2001"},{"article-title":"Scan mechanism for monitoring the state of internal signals of a VLSI microprocessor chip","year":"0","author":"carbine","key":"6"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2001.915026"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.1999.781382"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.2000.843853"},{"key":"8","doi-asserted-by":"crossref","first-page":"1358","DOI":"10.1109\/43.663825","article-title":"Arithmetic built-in self-test for DSP cores","volume":"16","author":"radecka","year":"1997","journal-title":"IEEE Trans Computer-Aided Design"}],"event":{"name":"2002 International Test Conference","acronym":"TEST-02","location":"Baltimore, MD, USA"},"container-title":["Proceedings. International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/8073\/22329\/01041810.pdf?arnumber=1041810","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,15]],"date-time":"2017-06-15T22:43:42Z","timestamp":1497566622000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1041810\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":13,"URL":"https:\/\/doi.org\/10.1109\/test.2002.1041810","relation":{},"subject":[]}}