{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,31]],"date-time":"2025-10-31T17:04:58Z","timestamp":1761930298445,"version":"build-2065373602"},"reference-count":9,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/test.2002.1041816","type":"proceedings-article","created":{"date-parts":[[2003,6,25]],"date-time":"2003-06-25T23:36:53Z","timestamp":1056584213000},"page":"648-656","source":"Crossref","is-referenced-by-count":3,"title":["Re-using DFT logic for functional and silicon debugging test"],"prefix":"10.1109","author":[{"family":"Xinli Gu","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Weili Wang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"K.","family":"Li","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Heon Kim","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"S.S.","family":"Chung","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1999.805650"},{"key":"2","first-page":"1002","article-title":"An effort-minimized logic BIST implementation method","author":"gu","year":"2001","journal-title":"Proc of International Test Conference"},{"journal-title":"The Boundary-Scan Handbook Second edition","year":"2000","author":"parker","key":"1"},{"article-title":"Design for at-speed test, diagnosis and measurement","year":"2000","author":"nadeau-dostie","key":"7"},{"article-title":"AC boundary-scan specification for MSA","year":"0","author":"baeg","key":"6"},{"key":"5","first-page":"30","article-title":"AC-JTAG: Empowering JTAG beyond testing DC nets","author":"baeg","year":"2001","journal-title":"Proc of International Test Conference"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2001.966696"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2001.966662"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2001.966624"}],"event":{"name":"2002 International Test Conference","acronym":"TEST-02","location":"Baltimore, MD, USA"},"container-title":["Proceedings. International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/8073\/22329\/01041816.pdf?arnumber=1041816","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,13]],"date-time":"2017-03-13T21:24:41Z","timestamp":1489440281000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1041816\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":9,"URL":"https:\/\/doi.org\/10.1109\/test.2002.1041816","relation":{},"subject":[]}}