{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,31]],"date-time":"2025-03-31T21:24:37Z","timestamp":1743456277642},"reference-count":7,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/test.2002.1041822","type":"proceedings-article","created":{"date-parts":[[2003,6,25]],"date-time":"2003-06-25T19:36:53Z","timestamp":1056569813000},"page":"700-709","source":"Crossref","is-referenced-by-count":40,"title":["Jitter testing for multi-Gigabit backplane SerDes - techniques to decompose and combine various types of jitter"],"prefix":"10.1109","author":[{"given":"Y.","family":"Cai","sequence":"first","affiliation":[]},{"given":"S.A.","family":"Werner","sequence":"additional","affiliation":[]},{"given":"G.J.","family":"Zhang","sequence":"additional","affiliation":[]},{"given":"M.J.","family":"Olsen","sequence":"additional","affiliation":[]},{"given":"R.D.","family":"Brink","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"journal-title":"Infiniband-TM Architecture Release 1 0 Vol 2-Physical Specifications Chapter 6 High Speed Electrical Signaling - 2 5Gb\/s","year":"2000","key":"3"},{"year":"2001","key":"2","article-title":"T11.2\/project 1316-DT\/rev 3.1: Fiber channel methodologies for jitter and signal quality specification"},{"year":"2001","key":"1","article-title":"Supplement to carrier sense multiple access with collision detection (CSMA\/CD) access method & physical layer specifications"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1999.805809"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/54.980054"},{"key":"5","article-title":"Comparison and correlation of signal integrity measurement techniques","author":"patrin","year":"2002","journal-title":"DesignCon"},{"key":"4","article-title":"SFI-5 proposed electrical specifications","author":"palkert","year":"0","journal-title":"Optical Internet Working Forum (OIF2001 033) January 2001"}],"event":{"name":"2002 International Test Conference","acronym":"TEST-02","location":"Baltimore, MD, USA"},"container-title":["Proceedings. International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/8073\/22329\/01041822.pdf?arnumber=1041822","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,13]],"date-time":"2017-03-13T17:27:43Z","timestamp":1489426063000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1041822\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":7,"URL":"https:\/\/doi.org\/10.1109\/test.2002.1041822","relation":{},"subject":[]}}