{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,18]],"date-time":"2026-04-18T16:41:13Z","timestamp":1776530473125,"version":"3.51.2"},"reference-count":28,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/test.2002.1041833","type":"proceedings-article","created":{"date-parts":[[2003,6,25]],"date-time":"2003-06-25T23:36:53Z","timestamp":1056584213000},"page":"796-803","source":"Crossref","is-referenced-by-count":68,"title":["Power driven chaining of flip-flops in scan architectures"],"prefix":"10.1109","author":[{"given":"Y.","family":"Bonhomme","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"P.","family":"Girard","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"C.","family":"Landrault","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"S.","family":"Pravossoudovitch","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"19","doi-asserted-by":"publisher","DOI":"10.1109\/GLSV.1999.757369"},{"key":"17","doi-asserted-by":"publisher","DOI":"10.1109\/43.736572"},{"key":"18","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.1998.706917"},{"key":"15","doi-asserted-by":"publisher","DOI":"10.1109\/ICVD.1994.282700"},{"key":"16","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2001.923464"},{"key":"13","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2000.893666"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1145\/378239.378396"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2001.923456"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2001.923454"},{"key":"21","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2000.894298"},{"key":"20","doi-asserted-by":"publisher","DOI":"10.1145\/225871.225877"},{"key":"22","article-title":"The traveling salesman problem: A case study in local optimization","author":"johnson","year":"1996","journal-title":"Local Search Algorithms in Combinatorial Optimization"},{"key":"23","article-title":"Graphes et Algorithmes","author":"gondran","year":"1979"},{"key":"24","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.1989.100747"},{"key":"25","year":"1998","journal-title":"PowerMill 5 1 User Guide"},{"key":"26","year":"1999","journal-title":"TestGen Tg 3 0 2 User Guide"},{"key":"27","article-title":"Silicon Ensemble","year":"2000","journal-title":"User Guide Cadence Design System"},{"key":"28","doi-asserted-by":"publisher","DOI":"10.1287\/opre.18.6.1138"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2002.1003802"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1993.313316"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.2000.843824"},{"key":"1","article-title":"Design-for-test for digital IC's and embedded core systems","author":"crouch","year":"1999"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1998.670912"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1145\/266021.266298"},{"key":"5","first-page":"49","article-title":"Low power serial built-in self-test","author":"hertwig","year":"1998","journal-title":"IEEE European Test Workshop"},{"key":"4","article-title":"Essentials of electronic testing","author":"bushnell","year":"2000"},{"key":"9","doi-asserted-by":"crossref","first-page":"670","DOI":"10.1109\/TEST.2001.966687","article-title":"A scheme to reduce power consumption during scan testing","author":"saxena","year":"2001","journal-title":"IEEE Int Test Conf"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2000.894297"}],"event":{"name":"2002 International Test Conference","location":"Baltimore, MD, USA","acronym":"TEST-02"},"container-title":["Proceedings. International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/8073\/22329\/01041833.pdf?arnumber=1041833","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,15]],"date-time":"2017-06-15T22:43:41Z","timestamp":1497566621000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1041833\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":28,"URL":"https:\/\/doi.org\/10.1109\/test.2002.1041833","relation":{},"subject":[]}}