{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,25]],"date-time":"2026-02-25T17:43:51Z","timestamp":1772041431683,"version":"3.50.1"},"reference-count":23,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/test.2002.1041837","type":"proceedings-article","created":{"date-parts":[[2003,6,25]],"date-time":"2003-06-25T23:36:53Z","timestamp":1056584213000},"page":"834-843","source":"Crossref","is-referenced-by-count":32,"title":["Generation of low power dissipation and high fault coverage patterns for scan-based BIST"],"prefix":"10.1109","author":[{"family":"Seongmoon Wang","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"19","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2001.966709"},{"key":"22","author":"weste","year":"1992","journal-title":"Principles of CMOS VLSI Design A Systems Perspective 2nd Edition"},{"key":"17","first-page":"82","article-title":"Low power state assignment targeting two-and multi-level logic implementation","author":"tsui","year":"1994","journal-title":"Proceedings IEEE International Conference on Computer-Aided Design"},{"key":"23","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1993.313316"},{"key":"18","doi-asserted-by":"publisher","DOI":"10.1147\/rd.332.0149"},{"key":"15","doi-asserted-by":"publisher","DOI":"10.1109\/92.736140"},{"key":"16","article-title":"Star test: The theory and its applications","volume":"19","author":"tsai","year":"2000","journal-title":"IEEE Trans on Computer-Aided Design of Integrated Circuit and System"},{"key":"13","article-title":"SIS: A system for sequential circuit synthesis","author":"sentovich","year":"1992"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1996.557122"},{"key":"11","first-page":"745","article-title":"A pragmatic approach to the design of self-Testing circuits","author":"saravia","year":"1989","journal-title":"Proceedings IEEE International Test Conference"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2001.923455"},{"key":"21","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1999.805617"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.2000.843823"},{"key":"20","first-page":"848","article-title":"A new BIST TPG for low heat dissipation","author":"wang","year":"1997","journal-title":"Proceedings IEEE International Test Conference"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/92.585217"},{"key":"1","author":"bardell","year":"1987","journal-title":"Built-In Test for VLSI Pseudorandom Techniques"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/43.238040"},{"key":"7","author":"goldberg","year":"1989","journal-title":"Genetic Algorithms in Search Optimization and Machine Learning"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1999.766696"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1999.805616"},{"key":"4","article-title":"Techniques for minimizing power disspation in scan and combinational circuits during test application","volume":"17","author":"dabhokar","year":"1998","journal-title":"IEEE Trans on Computer-Aided Design of Integrated Circuit and System"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.1993.580116"},{"key":"8","author":"golomb","year":"1982","journal-title":"Shift Register Sequences"}],"event":{"name":"2002 International Test Conference","location":"Baltimore, MD, USA","acronym":"TEST-02"},"container-title":["Proceedings. International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/8073\/22329\/01041837.pdf?arnumber=1041837","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,13]],"date-time":"2017-03-13T21:58:41Z","timestamp":1489442321000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1041837\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":23,"URL":"https:\/\/doi.org\/10.1109\/test.2002.1041837","relation":{},"subject":[]}}