{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,4,15]],"date-time":"2025-04-15T05:35:29Z","timestamp":1744695329555},"reference-count":10,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/test.2002.1041838","type":"proceedings-article","created":{"date-parts":[[2003,6,25]],"date-time":"2003-06-25T19:36:53Z","timestamp":1056569813000},"page":"844-850","source":"Crossref","is-referenced-by-count":26,"title":["Scan power reduction through test data transition frequency analysis"],"prefix":"10.1109","author":[{"given":"O.","family":"Sinanoglu","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"I.","family":"Bayraktaroglu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"A.","family":"Orailoglu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"3","first-page":"250","article-title":"ATPG for heat dissipation minimization during test application","author":"wang","year":"1998","journal-title":"ITC"},{"key":"2","first-page":"85","article-title":"Minimized power consumption for scan based BIST","author":"wunderlich","year":"1999","journal-title":"ITC"},{"article-title":"On the generation of test patterns for combinational circuits","year":"0","author":"lee","key":"10"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2002.1011129"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/43.736572"},{"key":"6","first-page":"35","article-title":"Adapting scan architectures for low power operation","author":"sankaralingam","year":"2000","journal-title":"VTS"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1049\/ip-cdt:20000537"},{"key":"4","first-page":"315","article-title":"An input control technique for power reduction in scan circuits during test application","author":"huang","year":"1999","journal-title":"ATS"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.1989.100747"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/92.585217"}],"event":{"name":"2002 International Test Conference","acronym":"TEST-02","location":"Baltimore, MD, USA"},"container-title":["Proceedings. International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/8073\/22329\/01041838.pdf?arnumber=1041838","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,13]],"date-time":"2017-03-13T17:27:34Z","timestamp":1489426054000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1041838\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/test.2002.1041838","relation":{},"subject":[]}}