{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,4]],"date-time":"2025-09-04T13:30:38Z","timestamp":1756992638964},"reference-count":9,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/test.2002.1041841","type":"proceedings-article","created":{"date-parts":[[2003,6,25]],"date-time":"2003-06-25T19:36:53Z","timestamp":1056569813000},"page":"870-878","source":"Crossref","is-referenced-by-count":12,"title":["Test setup simulation - a high-performance VHDL-based virtual test solution meeting industrial requirements"],"prefix":"10.1109","author":[{"given":"G.","family":"Krampl","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"M.","family":"Rona","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"H.","family":"Tauber","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"3","article-title":"Virtual test of complex mixed-signal telecommunication circuits reusing system level models","author":"einwich","year":"0","journal-title":"4th IEEE International Mixed-Signal Testing Workshop The Hague The Netherlands 1998"},{"key":"2","article-title":"Applying high level virtual test to a complex mixed-signal telecommunication circuit","author":"einwich","year":"0","journal-title":"5th International Mixed-Signal Testing Workshop Whistler BC Canada June 1999"},{"key":"1","article-title":"Model and simulator coupling for virtual test","author":"krampl","year":"0","journal-title":"6th IEEE International Mixed-Signal Testing Workshop Montpellier France 2000"},{"year":"1999","key":"7"},{"key":"6","article-title":"How virtual test becomes reality","author":"helmreich","year":"0","journal-title":"Proc European Design & Test Conference 1996 Paris 1996"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1989.82341"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1993.470710"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1998.743205"},{"key":"8","article-title":"Mixed-signal simulation techniques applied to virtual test","author":"fichet","year":"0","journal-title":"4th IEEE International Mixed-Signal Testing Workshop The Hague The Netherlands 1998"}],"event":{"name":"2002 International Test Conference","acronym":"TEST-02","location":"Baltimore, MD, USA"},"container-title":["Proceedings. International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/8073\/22329\/01041841.pdf?arnumber=1041841","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,13]],"date-time":"2017-03-13T17:32:36Z","timestamp":1489426356000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1041841\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":9,"URL":"https:\/\/doi.org\/10.1109\/test.2002.1041841","relation":{},"subject":[]}}