{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,5,21]],"date-time":"2025-05-21T06:10:50Z","timestamp":1747807850077,"version":"3.28.0"},"reference-count":29,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/test.2002.1041856","type":"proceedings-article","created":{"date-parts":[[2003,6,25]],"date-time":"2003-06-25T23:36:53Z","timestamp":1056584213000},"page":"1003-1012","source":"Crossref","is-referenced-by-count":11,"title":["Application of high-quality built-in test to industrial designs"],"prefix":"10.1109","author":[{"given":"K.","family":"Hatayama","sequence":"first","affiliation":[]},{"given":"M.","family":"Nakao","sequence":"additional","affiliation":[]},{"given":"Y.","family":"Kiyoshige","sequence":"additional","affiliation":[]},{"given":"K.","family":"Natsume","sequence":"additional","affiliation":[]},{"given":"Y.","family":"Sato","sequence":"additional","affiliation":[]},{"given":"T.","family":"Nagumo","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"19","doi-asserted-by":"publisher","DOI":"10.1109\/12.364534"},{"key":"17","first-page":"237","article-title":"LFSR-coded test patterns for scan designs","author":"koenemann","year":"1991","journal-title":"Proc ETC'91"},{"key":"18","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1992.527812"},{"key":"15","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2000.894197"},{"key":"16","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1996.556959"},{"key":"13","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.1996.569803"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1998.743304"},{"key":"11","first-page":"472","article-title":"STARBIST: Scan autocorrelated random pattern generation","author":"tsai","year":"1997","journal-title":"Proc 34th DA Conf"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/43.863645"},{"key":"21","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2001.966712"},{"key":"20","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2001.966711"},{"key":"22","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2001.990304"},{"key":"23","doi-asserted-by":"publisher","DOI":"10.1109\/APASIC.1999.824104"},{"key":"24","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2000.894198"},{"key":"25","article-title":"LBIST for PowerPC embedded core microprocessors: Feasible or not?","author":"pressly","year":"0","journal-title":"International Workshop on Microprocessor Test and Verification 1999"},{"key":"26","first-page":"874","article-title":"Deterministic built-in test with neigborhood pattern generator","volume":"e85 d","author":"nakao","year":"2002","journal-title":"IEICE Trans Inf & Syst"},{"key":"27","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1998.670871"},{"key":"28","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2001.990290"},{"key":"29","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.1989.100747"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2000.894216"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1999.805650"},{"key":"10","first-page":"878","article-title":"A new multiple weight set calculation algorithm","author":"kim","year":"2001","journal-title":"Proc ITC'01"},{"article-title":"Built-in test for VLSI","year":"1987","author":"bardel","key":"1"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1147\/rd.332.0149"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1994.527948"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1999.805649"},{"key":"4","first-page":"253","article-title":"Test point insertion for scan-based BIST","author":"seiss","year":"1991","journal-title":"Proc ETC'91"},{"key":"9","first-page":"868","article-title":"Low hardware overhead scan based 3-weighted random BIST","author":"wang","year":"2001","journal-title":"Proc ITC'01"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/4.92026"}],"event":{"name":"2002 International Test Conference","acronym":"TEST-02","location":"Baltimore, MD, USA"},"container-title":["Proceedings. International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/8073\/22329\/01041856.pdf?arnumber=1041856","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,13]],"date-time":"2017-03-13T21:50:09Z","timestamp":1489441809000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1041856\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":29,"URL":"https:\/\/doi.org\/10.1109\/test.2002.1041856","relation":{},"subject":[]}}