{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,3]],"date-time":"2024-09-03T20:25:46Z","timestamp":1725395146576},"reference-count":8,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/test.2002.1041861","type":"proceedings-article","created":{"date-parts":[[2003,6,25]],"date-time":"2003-06-25T23:36:53Z","timestamp":1056584213000},"page":"1050-1055","source":"Crossref","is-referenced-by-count":4,"title":["Wafer\/package test mix for optimal defect detection"],"prefix":"10.1109","author":[{"given":"P.C.","family":"Maxwell","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2000.894324"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2000.894231"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2001.966682"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2000.894237"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.2000.843843"},{"key":"ref7","first-page":"1119","article-title":"DIT-Focused Chip Testers: What Can They Really Do?","author":"robinson","year":"2000","journal-title":"Proc Intl Test Conf"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2000.894195"},{"key":"ref1","first-page":"1152","article-title":"Searching for Common Ground Between Low-Cost and High-Performance ATE Systems","author":"kinra","year":"2001","journal-title":"Proc Intl Test Conf"}],"event":{"name":"2002 International Test Conference","acronym":"TEST-02","location":"Baltimore, MD, USA"},"container-title":["Proceedings. International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/8073\/22329\/01041861.pdf?arnumber=1041861","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,13]],"date-time":"2017-03-13T21:55:03Z","timestamp":1489442103000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1041861\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":8,"URL":"https:\/\/doi.org\/10.1109\/test.2002.1041861","relation":{},"subject":[]}}