{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,29]],"date-time":"2025-09-29T11:56:09Z","timestamp":1759146969946},"reference-count":22,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/test.2002.1041875","type":"proceedings-article","created":{"date-parts":[[2003,6,25]],"date-time":"2003-06-25T19:36:53Z","timestamp":1056569813000},"page":"1169-1175","source":"Crossref","is-referenced-by-count":15,"title":["Adapting an SoC to ATE concurrent test capabilities"],"prefix":"10.1109","author":[{"given":"R.","family":"Dorsch","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"R.H.","family":"Rivera","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"H.J.","family":"Wunderlich","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"M.","family":"Fischer","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"journal-title":"The SPARC Architecture Manual Version 8","year":"1992","key":"19"},{"key":"22","doi-asserted-by":"publisher","DOI":"10.1109\/2.769444"},{"key":"17","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2000.894273"},{"article-title":"LEON web site","year":"2002","author":"gaisler","key":"18"},{"key":"15","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1998.743166"},{"key":"16","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1999.805786"},{"key":"13","article-title":"Concurrent testing races to catch up with SoCs","author":"wang","year":"2001","journal-title":"Integrated Communications Design (ICD)"},{"key":"14","article-title":"Concurrent test - A breakthrough approach for test cost reduction","author":"fischer","year":"0","journal-title":"European Manufacturing Test Conference (EMTC) 2001"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1998.743146"},{"key":"12","article-title":"The DFT-age ATE architecture - The multi-port ATE","author":"goto","year":"2000","journal-title":"SEMICON - SEMI Technology Symposium (STS) (Chiba Japan)"},{"key":"21","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1997.639613"},{"article-title":"Design philosophy of the wishbone soc architecture","year":"1999","author":"peterson","key":"3"},{"key":"20","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1998.743185"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/40.612211"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/2.769442"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2001.915014"},{"key":"7","doi-asserted-by":"crossref","first-page":"542","DOI":"10.1145\/277044.277190","article-title":"A fast and low cost testing technique for core-based system-on-chip","author":"ghosh","year":"1998","journal-title":"Proceedings 1998 Design and Automation Conference 35th DAC (Cat No 98CH36175) DAC"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1997.639593"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1998.670843"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1998.670842"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1023\/A:1008340519743"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1999.805839"}],"event":{"name":"2002 International Test Conference","acronym":"TEST-02","location":"Baltimore, MD, USA"},"container-title":["Proceedings. International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/8073\/22329\/01041875.pdf?arnumber=1041875","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,15]],"date-time":"2017-06-15T18:43:38Z","timestamp":1497552218000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1041875\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":22,"URL":"https:\/\/doi.org\/10.1109\/test.2002.1041875","relation":{},"subject":[]}}