{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,6]],"date-time":"2024-09-06T20:08:19Z","timestamp":1725653299719},"reference-count":0,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/test.2002.1041904","type":"proceedings-article","created":{"date-parts":[[2003,6,25]],"date-time":"2003-06-25T19:36:53Z","timestamp":1056569813000},"page":"1197","source":"Crossref","is-referenced-by-count":1,"title":["Is scan (alone) sufficient to test today's microprocessors? Not quite, but we can't get the job done without it"],"prefix":"10.1109","author":[{"given":"G.","family":"Giles","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","event":{"name":"2002 International Test Conference","acronym":"TEST-02","location":"Baltimore, MD, USA"},"container-title":["Proceedings. International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/8073\/22329\/01041904.pdf?arnumber=1041904","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,13]],"date-time":"2017-03-13T17:26:01Z","timestamp":1489425961000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1041904\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":0,"URL":"https:\/\/doi.org\/10.1109\/test.2002.1041904","relation":{},"subject":[]}}