{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T23:03:08Z","timestamp":1725490988895},"reference-count":0,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/test.2002.1041920","type":"proceedings-article","created":{"date-parts":[[2003,6,25]],"date-time":"2003-06-25T19:36:53Z","timestamp":1056569813000},"page":"1216","source":"Crossref","is-referenced-by-count":0,"title":["The impact of outsourcing on test"],"prefix":"10.1109","author":[{"given":"F.","family":"Muradali","sequence":"first","affiliation":[]}],"member":"263","event":{"name":"2002 International Test Conference","acronym":"TEST-02","location":"Baltimore, MD, USA"},"container-title":["Proceedings. International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/8073\/22329\/01041920.pdf?arnumber=1041920","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,13]],"date-time":"2017-03-13T17:18:31Z","timestamp":1489425511000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1041920\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":0,"URL":"https:\/\/doi.org\/10.1109\/test.2002.1041920","relation":{},"subject":[]}}