{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T04:57:22Z","timestamp":1725512242170},"reference-count":0,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/test.2002.1041924","type":"proceedings-article","created":{"date-parts":[[2003,6,25]],"date-time":"2003-06-25T23:36:53Z","timestamp":1056584213000},"page":"1221","source":"Crossref","is-referenced-by-count":1,"title":["Test and repair of non-volatile commodity and embedded memories (NAND flash memory)"],"prefix":"10.1109","author":[{"given":"R.","family":"Shirota","sequence":"first","affiliation":[]}],"member":"263","event":{"name":"2002 International Test Conference","acronym":"TEST-02","location":"Baltimore, MD, USA"},"container-title":["Proceedings. International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/8073\/22329\/01041924.pdf?arnumber=1041924","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,13]],"date-time":"2017-03-13T21:18:36Z","timestamp":1489439916000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1041924\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":0,"URL":"https:\/\/doi.org\/10.1109\/test.2002.1041924","relation":{},"subject":[]}}