{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,8,6]],"date-time":"2024-08-06T07:12:57Z","timestamp":1722928377047},"reference-count":11,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/test.2003.1270821","type":"proceedings-article","created":{"date-parts":[[2004,7,8]],"date-time":"2004-07-08T16:05:44Z","timestamp":1089302744000},"page":"23-28","source":"Crossref","is-referenced-by-count":4,"title":["EEPROM memory: threshold voltage built in self diagnosis"],"prefix":"10.1109","volume":"1","author":[{"given":"J.M.","family":"Portal","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"H.","family":"Aziza","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"D.","family":"Nee","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"3","first-page":"319","article-title":"An Automated Failure Analysis (AFA) Methodology for Repeated Structures","author":"lepejian","year":"1994","journal-title":"Proc 12th IEEE VLSI Test Symp"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/5.622505"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2002.1010345"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1063\/1.1657043"},{"journal-title":"Circuit Design for CMOS VLSI","year":"1997","author":"uyemura","key":"7"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4615-5015-0"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/54.922801"},{"key":"4","first-page":"143","article-title":"Carafe: A Software Tool for Failure Analysis","author":"jee","year":"1993","journal-title":"Proc Of Int'l Symp On Testing and Failure Analysis"},{"journal-title":"Eldo User's Manual","year":"1998","key":"9"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/4.777107"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041742"}],"event":{"name":"International Test Conference, 2003. ITC 2003.","location":"Washington, DC, USA"},"container-title":["International Test Conference, 2003. Proceedings. ITC 2003."],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/8970\/28457\/01270821.pdf?arnumber=1270821","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,13]],"date-time":"2017-03-13T20:51:13Z","timestamp":1489438273000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1270821\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":11,"URL":"https:\/\/doi.org\/10.1109\/test.2003.1270821","relation":{},"subject":[]}}