{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,24]],"date-time":"2025-03-24T06:43:53Z","timestamp":1742798633027},"reference-count":13,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/test.2003.1270825","type":"proceedings-article","created":{"date-parts":[[2004,7,8]],"date-time":"2004-07-08T16:05:44Z","timestamp":1089302744000},"page":"58-66","source":"Crossref","is-referenced-by-count":14,"title":["Effects of deterministic jitter in a cable on jitter tolerance measurements"],"prefix":"10.1109","volume":"1","author":[{"given":"T.J.","family":"Yamaguchi","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"M.","family":"Soma","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"M.","family":"Ishidal","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"M.","family":"Kurosawa","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"H.","family":"Musha","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"journal-title":"Max3880 + 3 3V 2 488Gbps SDH\/SONET 1 16 Deserializer with Clock Recovery","year":"1999","key":"13"},{"journal-title":"High-Speed Digital Design","year":"1993","author":"johnson","key":"11"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041805"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/4.972148"},{"journal-title":"Fibre Channel- Methodologies for Jitter and Signal Quality Specification-MJSQ","year":"2002","key":"2"},{"journal-title":"SONET OC-192 Transport System Generic Criteria","year":"1998","key":"1"},{"journal-title":"Telecommunications Measurements Analysis and Instrumentation","year":"1987","author":"feher","key":"10"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2001.923425"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041824"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.2000.843870"},{"journal-title":"PCI Express Base Specification Revision 1 0a","year":"2003","key":"4"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/82.749085"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/4.585289"}],"event":{"name":"International Test Conference, 2003. ITC 2003.","location":"Washington, DC, USA"},"container-title":["International Test Conference, 2003. Proceedings. ITC 2003."],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/8970\/28457\/01270825.pdf?arnumber=1270825","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,13]],"date-time":"2017-03-13T12:56:26Z","timestamp":1489409786000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1270825\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":13,"URL":"https:\/\/doi.org\/10.1109\/test.2003.1270825","relation":{},"subject":[]}}