{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,8,6]],"date-time":"2024-08-06T07:13:18Z","timestamp":1722928398434},"reference-count":10,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/test.2003.1270842","type":"proceedings-article","created":{"date-parts":[[2004,7,8]],"date-time":"2004-07-08T16:05:44Z","timestamp":1089302744000},"page":"210-217","source":"Crossref","is-referenced-by-count":2,"title":["Method of reducing contactor effect when testing high-precision adcs"],"prefix":"10.1109","volume":"1","author":[{"given":"G.","family":"Maugard","sequence":"first","affiliation":[]},{"given":"C.","family":"Wegener","sequence":"additional","affiliation":[]},{"given":"T.","family":"O'Dwye","sequence":"additional","affiliation":[]},{"given":"M.P.","family":"Kennedy","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"journal-title":"Reducing the Cost of Semiconductor Testing with High-performance Contacting Technology","year":"0","key":"3"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/81.645145"},{"journal-title":"Matrix Computations","year":"1996","author":"golub","key":"10"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041839"},{"journal-title":"IEEE Std 1241-2000","article-title":"IEEE standard for terminology and test methods for analog-to-digital converters","year":"2000","key":"7"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041806"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041791"},{"journal-title":"Modelling Consulting Services","year":"0","key":"4"},{"key":"9","article-title":"Testing ADCs for static and dynamic nonlinearities - Killing two birds with one stone","author":"wegener","year":"2002","journal-title":"Proc ADDA and EWADC"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/TCS.1986.1086004"}],"event":{"name":"International Test Conference, 2003. ITC 2003.","location":"Washington, DC, USA"},"container-title":["International Test Conference, 2003. Proceedings. ITC 2003."],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/8970\/28457\/01270842.pdf?arnumber=1270842","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,13]],"date-time":"2017-03-13T22:11:25Z","timestamp":1489443085000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1270842\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/test.2003.1270842","relation":{},"subject":[]}}