{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,19]],"date-time":"2025-03-19T13:38:41Z","timestamp":1742391521291,"version":"3.28.0"},"reference-count":19,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/test.2003.1270853","type":"proceedings-article","created":{"date-parts":[[2004,7,8]],"date-time":"2004-07-08T16:05:44Z","timestamp":1089302744000},"page":"309-318","source":"Crossref","is-referenced-by-count":12,"title":["Progressive bridge identification"],"prefix":"10.1109","volume":"1","author":[{"given":"T.J.","family":"Vogels","sequence":"first","affiliation":[]},{"given":"W.","family":"Maly","sequence":"additional","affiliation":[]},{"given":"R.D.S.","family":"Blanton","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"19","article-title":"On the Generation of Test Patterns for Combinational Circuits","author":"lee","year":"0","journal-title":"Technical Report No 12_93"},{"key":"17","doi-asserted-by":"publisher","DOI":"10.1145\/337292.337779"},{"journal-title":"Fault Tuples Theory and Applications","year":"2003","author":"dwarakanath","key":"18"},{"journal-title":"Digital Systems Testing and Testable Design","year":"1990","author":"abromovici","key":"15"},{"key":"16","first-page":"695","article-title":"A Neutral Netlist of 10 Combinational Benchmark Designs and a Special Translator in Fortran","author":"brglez","year":"1985","journal-title":"International Symposium on Circuits and Systems"},{"key":"13","doi-asserted-by":"publisher","DOI":"10.1109\/4.278347"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1993.470717"},{"key":"11","doi-asserted-by":"crossref","first-page":"520","DOI":"10.1145\/157485.165012","article-title":"an algorithm for diagnosing two-line bridging faults in combinational circuits","author":"chakravarty","year":"1993","journal-title":"30th ACM\/IEEE Design Automation Conference"},{"key":"12","doi-asserted-by":"crossref","first-page":"377","DOI":"10.1007\/BF00135341","article-title":"IDDQ Measurement based Diagnosis of Bridging Faults in Combinational Circuits","volume":"3","author":"chakravarty","year":"1992","journal-title":"Journal of Electronic Testing Theory and Applications"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1990.114104"},{"key":"2","article-title":"A Multi-Stage Approach to Fault Identification Using Fault Tuples","author":"desineni","year":"2003","journal-title":"ISTFA"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2003.1271071"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/43.720323"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/54.902819"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2000.894213"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.1995.480011"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1997.639703"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.1997.643595"},{"key":"8","article-title":"Bridging the Gap between Logical Diagnosis and Physical Analysis","author":"drummonds","year":"2002","journal-title":"IEEE International Workshop on Defect Based Testing (DBT)"}],"event":{"name":"International Test Conference, 2003. ITC 2003.","location":"Washington, DC, USA"},"container-title":["International Test Conference, 2003. Proceedings. ITC 2003."],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/8970\/28457\/01270853.pdf?arnumber=1270853","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,16]],"date-time":"2017-06-16T04:40:34Z","timestamp":1497588034000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1270853\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":19,"URL":"https:\/\/doi.org\/10.1109\/test.2003.1270853","relation":{},"subject":[]}}