{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,22]],"date-time":"2024-10-22T16:38:44Z","timestamp":1729615124362,"version":"3.28.0"},"reference-count":12,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/test.2003.1270857","type":"proceedings-article","created":{"date-parts":[[2004,7,8]],"date-time":"2004-07-08T20:05:44Z","timestamp":1089317144000},"page":"349-357","source":"Crossref","is-referenced-by-count":0,"title":["A new maximal diagnosis algorithm for bus-structured systems"],"prefix":"10.1109","volume":"1","author":[{"family":"YongJoon Kim","sequence":"first","affiliation":[]},{"family":"DongSub Song","sequence":"additional","affiliation":[]},{"family":"YongSeung Shin","sequence":"additional","affiliation":[]},{"family":"Sunghoon Chun","sequence":"additional","affiliation":[]},{"family":"Sungho Kang","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","first-page":"126","article-title":"Testing and Diagnosis of Interconnects Using Boundary Scan","author":"hassan","year":"1985","journal-title":"Proceedings of International Test Conference"},{"key":"ref3","first-page":"52","article-title":"Interconnect testing with boundary scan","author":"wagner","year":"1987","journal-title":"Proceedings of International Test Conference"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1989.82278"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1989.82279"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ETC.1993.246595"},{"key":"ref5","first-page":"96","article-title":"Maximal Diagnosis for Wiring Networks","author":"lien","year":"1991","journal-title":"Proceedings of International Test Conference"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/54.980053"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/43.159992"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1990.114069"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/T-C.1974.223950"},{"key":"ref9","doi-asserted-by":"crossref","first-page":"430","DOI":"10.1109\/92.407000","article-title":"Optimal Interconnect Diagnosis of Wiring Networks","volume":"3","author":"shi","year":"1995","journal-title":"IEEE Transactions on Very Large Scale Integration System"},{"year":"2001","key":"ref1","article-title":"IEEE Standard Test Access Port and Boundary-Scan Architecture"}],"event":{"name":"International Test Conference, 2003. ITC 2003.","location":"Washington, DC, USA"},"container-title":["International Test Conference, 2003. Proceedings. ITC 2003."],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/8970\/28457\/01270857.pdf?arnumber=1270857","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,16]],"date-time":"2017-06-16T08:40:33Z","timestamp":1497602433000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1270857\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/test.2003.1270857","relation":{},"subject":[]}}