{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,8,6]],"date-time":"2024-08-06T07:13:46Z","timestamp":1722928426994},"reference-count":16,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/test.2003.1270864","type":"proceedings-article","created":{"date-parts":[[2004,7,8]],"date-time":"2004-07-08T20:05:44Z","timestamp":1089317144000},"page":"403-409","source":"Crossref","is-referenced-by-count":5,"title":["Automatic diagnostic program generation for mixed signal load board"],"prefix":"10.1109","volume":"1","author":[{"given":"K.K.","family":"Pinjala","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"B.C.","family":"Kim","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"P.","family":"Variyam","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"journal-title":"Mixed Signal Testing of Integrated Analog Circuits and Modules","year":"1999","author":"liu","key":"15"},{"key":"16","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.1994.629894"},{"key":"13","doi-asserted-by":"publisher","DOI":"10.1007\/BF00134729"},{"journal-title":"Efficient techniques for fault diagnosis of analog circuits using dictionary approach","year":"1997","author":"babu","key":"14"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2000.894193"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1993.313319"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/TCS.1979.1084665"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/54.124515"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/TCS.1983.1085352"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1007\/BF01204680"},{"key":"7","first-page":"388","article-title":"Limited Access Testing: IEEE 1149.4","author":"mcdermid","year":"1998","journal-title":"Proc Int'l Test Conference"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1007\/BF01204680"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.1987.6312710"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1007\/BF00137574"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1002\/cta.4490130205"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/TCS.1979.1084665"}],"event":{"name":"International Test Conference, 2003. ITC 2003.","location":"Washington, DC, USA"},"container-title":["International Test Conference, 2003. Proceedings. ITC 2003."],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/8970\/28457\/01270864.pdf?arnumber=1270864","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,14]],"date-time":"2017-03-14T01:55:54Z","timestamp":1489456554000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1270864\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":16,"URL":"https:\/\/doi.org\/10.1109\/test.2003.1270864","relation":{},"subject":[]}}