{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,8,6]],"date-time":"2024-08-06T07:13:47Z","timestamp":1722928427331},"reference-count":3,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/test.2003.1270865","type":"proceedings-article","created":{"date-parts":[[2004,7,8]],"date-time":"2004-07-08T20:05:44Z","timestamp":1089317144000},"page":"410-414","source":"Crossref","is-referenced-by-count":0,"title":["A high precision iddq measurement system with improved dynamic load regulation"],"prefix":"10.1109","volume":"1","author":[{"given":"N.","family":"Sato","sequence":"first","affiliation":[]},{"given":"Y.","family":"Hashimoto","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041846"},{"key":"2","first-page":"1121","article-title":"PANEL 3: SIA Roadmaps: Sunset Boulevard for IDDQ","author":"baker","year":"1999","journal-title":"Int Test Conf"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/5.843000"}],"event":{"name":"International Test Conference, 2003. ITC 2003.","location":"Washington, DC, USA"},"container-title":["International Test Conference, 2003. Proceedings. ITC 2003."],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/8970\/28457\/01270865.pdf?arnumber=1270865","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,14]],"date-time":"2017-03-14T02:05:27Z","timestamp":1489457127000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1270865\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":3,"URL":"https:\/\/doi.org\/10.1109\/test.2003.1270865","relation":{},"subject":[]}}