{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,28]],"date-time":"2025-10-28T10:28:07Z","timestamp":1761647287639,"version":"3.28.0"},"reference-count":16,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/test.2003.1270868","type":"proceedings-article","created":{"date-parts":[[2004,7,8]],"date-time":"2004-07-08T20:05:44Z","timestamp":1089317144000},"page":"431-440","source":"Crossref","is-referenced-by-count":18,"title":["Application and analysis of rt-level software-based self-testing for embedded processor cores"],"prefix":"10.1109","volume":"1","author":[{"given":"N.","family":"Kranitis","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"G.","family":"Xenoulis","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"A.","family":"Paschalis","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"D.","family":"Gizopoulos","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Y.","family":"Zorian","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"journal-title":"Plasma CPU Model","year":"0","key":"15"},{"journal-title":"Arithmetic Module Generator","year":"0","author":"pihl","key":"16"},{"key":"13","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.1999.761106"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1109\/12.795222"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2002.1018130"},{"key":"12","doi-asserted-by":"crossref","first-page":"290","DOI":"10.1109\/43.908472","article-title":"Realization-Independent ATPG for Designs with Unimplemented Blocks'","volume":"20","author":"kim","year":"2001","journal-title":"IEEE Transactions on CAD of Integrated Circuits and Systems"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1998.743296"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1023\/A:1008305820979"},{"year":"0","key":"1"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041810"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/43.536720"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2002.1011144"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2001.915026"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1999.766644"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2002.1011142"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/43.913755"}],"event":{"name":"International Test Conference, 2003. ITC 2003.","location":"Washington, DC, USA"},"container-title":["International Test Conference, 2003. Proceedings. ITC 2003."],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/8970\/28457\/01270868.pdf?arnumber=1270868","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,16]],"date-time":"2017-06-16T08:40:33Z","timestamp":1497602433000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1270868\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":16,"URL":"https:\/\/doi.org\/10.1109\/test.2003.1270868","relation":{},"subject":[]}}