{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,8,6]],"date-time":"2024-08-06T07:13:58Z","timestamp":1722928438098},"reference-count":3,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/test.2003.1270875","type":"proceedings-article","created":{"date-parts":[[2004,7,8]],"date-time":"2004-07-08T20:05:44Z","timestamp":1089317144000},"page":"494-502","source":"Crossref","is-referenced-by-count":3,"title":["IEEE 1149.6 - a practical perspective"],"prefix":"10.1109","volume":"1","author":[{"given":"B.","family":"Eklow","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"C.","family":"Barnhart","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"M.","family":"Ricchetti","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"T.","family":"Borroz","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref3","article-title":"Interconnect Testing With Boundary Scan","author":"wagner","year":"1987","journal-title":"Proceedings International Test Conference"},{"journal-title":"IEEE Std 1149 6-2003 IEEESTD","article-title":"IEEE Standard for Boundary-Scan Testing of Advanced Digital Networks","year":"0","key":"ref2"},{"journal-title":"IEEE Std 1149 1-2001","article-title":"IEEE Standard Test Access Port and Boundary-Scan Architecture","year":"0","key":"ref1"}],"event":{"name":"International Test Conference, 2003. ITC 2003.","location":"Washington, DC, USA"},"container-title":["International Test Conference, 2003. Proceedings. ITC 2003."],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/8970\/28457\/01270875.pdf?arnumber=1270875","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,14]],"date-time":"2017-03-14T02:03:44Z","timestamp":1489457024000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1270875\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":3,"URL":"https:\/\/doi.org\/10.1109\/test.2003.1270875","relation":{},"subject":[]}}