{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,23]],"date-time":"2024-10-23T01:23:49Z","timestamp":1729646629769,"version":"3.28.0"},"reference-count":8,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/test.2003.1270914","type":"proceedings-article","created":{"date-parts":[[2004,7,8]],"date-time":"2004-07-08T16:05:44Z","timestamp":1089302744000},"page":"818-827","source":"Crossref","is-referenced-by-count":6,"title":["Outlier detection for dppm reduction"],"prefix":"10.1109","volume":"1","author":[{"given":"P.","family":"Buxton","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"P.","family":"Tabor","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"journal-title":"Introduction to Statistical Quality Control","year":"0","author":"montgomery","key":"3"},{"journal-title":"QS9000 Quality Systems for Automotive Component Suppliers","year":"0","key":"2"},{"journal-title":"Measurement and Test","year":"1999","author":"edgar","key":"1"},{"key":"7","doi-asserted-by":"crossref","DOI":"10.1109\/VTS.2002.1011115","article-title":"Evaluation of Effectiveness of Median of Absolute Deviations Outlier Rejection-based IddQ Testing for Burn-in Reduction","author":"sabade","year":"2002","journal-title":"IEEE VLSI Test Symposium"},{"journal-title":"Guidelines for Part Average Testing","year":"0","key":"6"},{"journal-title":"Dealing with Outliers","year":"2000","author":"high","key":"5"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/IDDQ.1996.557801"},{"key":"8","first-page":"10","article-title":"How to Detect and Handle Outliers","volume":"16","author":"iglewicz","year":"1993","journal-title":"The ASQC Basic References in Quality Control Statistical Techniques"}],"event":{"name":"International Test Conference, 2003. ITC 2003.","location":"Washington, DC, USA"},"container-title":["International Test Conference, 2003. Proceedings. ITC 2003."],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/8970\/28457\/01270914.pdf?arnumber=1270914","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,4,2]],"date-time":"2020-04-02T13:51:37Z","timestamp":1585835497000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1270914\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":8,"URL":"https:\/\/doi.org\/10.1109\/test.2003.1270914","relation":{},"subject":[]}}