{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,8,6]],"date-time":"2024-08-06T07:14:39Z","timestamp":1722928479788},"reference-count":10,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/test.2003.1271087","type":"proceedings-article","created":{"date-parts":[[2004,7,8]],"date-time":"2004-07-08T16:05:44Z","timestamp":1089302744000},"page":"998-1007","source":"Crossref","is-referenced-by-count":1,"title":["The P1500 DFT disclosure document: a standard to communicate mergeable core DFT data"],"prefix":"10.1109","volume":"1","author":[{"given":"M.G.","family":"Wahl","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"S.","family":"Bhawmik","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"K.","family":"Zarrineh","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"P.","family":"Ghosh","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"S.","family":"Davidson","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"P.","family":"Harrod","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"3","DOI":"10.1109\/VTEST.1999.766708"},{"year":"1994","author":"de micheli","journal-title":"Synthesis and Optimization of Digital Circuits","key":"2"},{"key":"10","first-page":"191","article-title":"Test requirements for embedded corebased systems and IEEE P1500","author":"zorian","year":"1997","journal-title":"ITC 1997"},{"key":"1","first-page":"246","author":"chickermane","year":"1997","journal-title":"Addressing Early Design-for-Test Synthesis in a Production Environment"},{"key":"7","article-title":"A System Test Cost Model as Influenced by Business Plan","author":"orton","year":"1999","journal-title":"2nd IEEE International Workshop on System Test and Diagnosis"},{"doi-asserted-by":"publisher","key":"6","DOI":"10.1109\/54.980051"},{"doi-asserted-by":"publisher","key":"5","DOI":"10.1109\/TEST.1999.805786"},{"doi-asserted-by":"publisher","key":"4","DOI":"10.1109\/TEST.2000.894273"},{"doi-asserted-by":"publisher","key":"9","DOI":"10.1109\/TEST.1997.639664"},{"doi-asserted-by":"publisher","key":"8","DOI":"10.1109\/54.953274"}],"event":{"name":"International Test Conference, 2003. ITC 2003.","location":"Washington, DC, USA"},"container-title":["International Test Conference, 2003. Proceedings. ITC 2003."],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/8970\/28457\/01271087.pdf?arnumber=1271087","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,13]],"date-time":"2017-03-13T21:43:31Z","timestamp":1489441411000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1271087\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/test.2003.1271087","relation":{},"subject":[]}}