{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,28]],"date-time":"2025-11-28T12:05:53Z","timestamp":1764331553269},"reference-count":19,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/test.2003.1271092","type":"proceedings-article","created":{"date-parts":[[2004,7,8]],"date-time":"2004-07-08T16:05:44Z","timestamp":1089302744000},"page":"1041-1050","source":"Crossref","is-referenced-by-count":44,"title":["Using logic models to predict the detection behavior of statistical timing defects"],"prefix":"10.1109","volume":"1","author":[{"given":"L.-C.","family":"Wang","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"A.","family":"Krstic","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"L.","family":"Lee","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Kwang-Ting Cheng","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"19","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.1999.810726"},{"key":"17","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1998.743275"},{"key":"18","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2002.1033788"},{"key":"15","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2000.893601"},{"key":"16","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2000.893615"},{"key":"13","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2001.923453"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1109\/MTDT.2002.1029765"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/MTDT.1996.782499"},{"key":"12","first-page":"468","article-title":"Error catch and analysis for semiconductor memories using March tests","author":"wu","year":"2000","journal-title":"Proc IEEE\/ACM Int Conf Computer-Aided Design (ICCAD)"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/54.922801"},{"journal-title":"International technology roadmap for semiconductors (ITRS) 2001 edition","year":"2001","key":"2"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.2002.1012716"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.2000.843857"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/ASMC.2000.902586"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1998.743277"},{"key":"5","first-page":"292","article-title":"Enabling embedded memory diagnosis via test response compression","author":"chen","year":"2001","journal-title":"Proc IEEE VLSI Test Symp (VTS)"},{"key":"4","article-title":"An overview of advanced failure analysis techniques for Pentium and Pentium Pro microprocessors","author":"hong","year":"1998","journal-title":"Intel Technology Journal"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1994.528034"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1988.207820"}],"event":{"name":"International Test Conference, 2003. ITC 2003.","location":"Washington, DC, USA"},"container-title":["International Test Conference, 2003. Proceedings. ITC 2003."],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/8970\/28457\/01271092.pdf?arnumber=1271092","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,13]],"date-time":"2017-03-13T21:43:33Z","timestamp":1489441413000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1271092\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":19,"URL":"https:\/\/doi.org\/10.1109\/test.2003.1271092","relation":{},"subject":[]}}