{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,5,30]],"date-time":"2025-05-30T06:06:07Z","timestamp":1748585167255},"reference-count":15,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/test.2003.1271104","type":"proceedings-article","created":{"date-parts":[[2004,7,8]],"date-time":"2004-07-08T16:05:44Z","timestamp":1089302744000},"page":"1155-1163","source":"Crossref","is-referenced-by-count":1,"title":["Analog circuit test using transfer function coefficient estimates"],"prefix":"10.1109","volume":"1","author":[{"family":"Zhen Guo","sequence":"first","affiliation":[]},{"given":"J.","family":"Savir","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"journal-title":"Contemporary Linear Systems Using MATLAB","year":"0","author":"strum","key":"15"},{"journal-title":"MATLAB Version 6 Control Toolbox","year":"0","key":"13"},{"journal-title":"System Identification Theory for the User","year":"1987","author":"ljung","key":"14"},{"journal-title":"Analog Integrated Circuit Design","year":"1997","author":"johns","key":"11"},{"journal-title":"MATLAB Version 6 System Identification Toolbox","year":"0","key":"12"},{"key":"3","first-page":"182","article-title":"Verification of Delta-Sigma Converters using Adaptive Regression Modelling","author":"roh","year":"2000","journal-title":"Proc ICCAD"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1996.557077"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/43.986428"},{"key":"10","article-title":"An introduction to linear control sytem","author":"fortmann","year":"1977","journal-title":"Marcel Dekker Inc"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.2002.1106781"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/43.55186"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1023\/A:1008349817903"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/43.748163"},{"journal-title":"Analysis of Linear Circuits","year":"1989","author":"clayton","key":"9"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2002.1181682"}],"event":{"name":"International Test Conference, 2003. ITC 2003.","location":"Washington, DC, USA"},"container-title":["International Test Conference, 2003. Proceedings. ITC 2003."],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/8970\/28457\/01271104.pdf?arnumber=1271104","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,13]],"date-time":"2017-03-13T22:04:32Z","timestamp":1489442672000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1271104\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":15,"URL":"https:\/\/doi.org\/10.1109\/test.2003.1271104","relation":{},"subject":[]}}