{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T16:54:33Z","timestamp":1725555273090},"reference-count":0,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2004]]},"DOI":"10.1109\/test.2004.1386931","type":"proceedings-article","created":{"date-parts":[[2011,9,16]],"date-time":"2011-09-16T20:02:36Z","timestamp":1316203356000},"page":"14-16","source":"Crossref","is-referenced-by-count":0,"title":["TTTC: Test Technology Technical Council"],"prefix":"10.1109","member":"263","event":{"name":"Proceedings. International Test Conference 2004","start":{"date-parts":[[2004,10,26]]},"location":"Charlotte, NC, USA","end":{"date-parts":[[2004,10,28]]}},"container-title":["2004 International Conferce on Test"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/9526\/30190\/01386931.pdf?arnumber=1386931","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,2,6]],"date-time":"2020-02-06T17:34:20Z","timestamp":1581010460000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/1386931\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2004]]},"references-count":0,"URL":"https:\/\/doi.org\/10.1109\/test.2004.1386931","relation":{},"subject":[],"published":{"date-parts":[[2004]]}}}