{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,23]],"date-time":"2024-10-23T02:28:12Z","timestamp":1729650492396,"version":"3.28.0"},"reference-count":21,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/test.2004.1386938","type":"proceedings-article","created":{"date-parts":[[2005,3,21]],"date-time":"2005-03-21T20:07:39Z","timestamp":1111435659000},"page":"67-76","source":"Crossref","is-referenced-by-count":0,"title":["Spectral analysis for statistical response compaction during built-in self-testing"],"prefix":"10.1109","author":[{"family":"Omar Khan","sequence":"first","affiliation":[]},{"given":"M.L.","family":"Bushnell","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1996.556962"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2002.1011120"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1980.1051391"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/FTCS.1996.534593"},{"key":"ref14","first-page":"260","article-title":"A Fault Simulation Based Test Pattern Generator for Synchronous Sequential Circuits","author":"pomeranz","year":"1999","journal-title":"Proc 17thVLSI Test Symp"},{"key":"ref15","first-page":"1083","article-title":"The Effects of Test Compaction on Fault Diagnosis","author":"pomeranz","year":"1999","journal-title":"Proc of 'the In-terntional Test Conference"},{"key":"ref16","first-page":"111","article-title":"On Improving Static Test Compaction for Sequential Circuits","author":"pomeranz","year":"2001","journal-title":"Proc of the 14thInternational Conference on VLSI Design"},{"key":"ref17","doi-asserted-by":"crossref","first-page":"293","DOI":"10.1109\/TCAD.2002.807885","article-title":"Reverse-Order- Restoration- Based Static Test Compaction for Synchrounous Sequential Circuits","volume":"22","author":"pomeranz","year":"2003","journal-title":"IEEE Transactions on Computer-Aided Design of Integrated Circuits &Systems"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1980.1675603"},{"journal-title":"Test Generation Using Spectral BIST","year":"2003","author":"upadhyayula","key":"ref19"},{"key":"ref4","first-page":"366","article-title":"Signature Analysis of Multi-Output Circuits","author":"david","year":"1984","journal-title":"Proc Int Symp Fault-Tolerant Comput"},{"journal-title":"Essentials of Electronic Testing For Digital Memory & Mixed-Signal VLSI Circuits","year":"2000","author":"bushnell","key":"ref3"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2001.915025"},{"key":"ref5","first-page":"2","article-title":"Signature Analysis: A New Digital Field Service Method","volume":"28","author":"frohwerk","year":"1977","journal-title":"Hewlett-Packard Journal"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1976.1674661"},{"key":"ref7","first-page":"163","article-title":"Novel Spectral Techniques for Built-In Self-Test in a System-on-a-Chip Environment","author":"giani","year":"2001","journal-title":"Proc 19th VLSI Test Symp"},{"journal-title":"Built-In Test for VLSI Pseudorandom Techniques","year":"1987","author":"bardell","key":"ref2"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2000.894277"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1978.1674950"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/43.3132"},{"key":"ref21","article-title":"On Random Pattern Generation with the Selifsh Gene Algorithm for Testing Sequential Circuits","author":"zhang","year":"2004","journal-title":"Proc of the International Test Conf"}],"event":{"name":"International Test Conference 2004","acronym":"TEST-04","location":"Charlotte, NC, USA"},"container-title":["2004 International Conferce on Test"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/9526\/30190\/01386938.pdf?arnumber=1386938","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,16]],"date-time":"2017-06-16T17:34:12Z","timestamp":1497634452000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1386938\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":21,"URL":"https:\/\/doi.org\/10.1109\/test.2004.1386938","relation":{},"subject":[]}}