{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,6]],"date-time":"2024-09-06T12:24:07Z","timestamp":1725625447614},"reference-count":14,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/test.2004.1386941","type":"proceedings-article","created":{"date-parts":[[2005,3,7]],"date-time":"2005-03-07T13:32:27Z","timestamp":1110202347000},"page":"95-104","source":"Crossref","is-referenced-by-count":30,"title":["An automated, complete, structural test solution for SERDES"],"prefix":"10.1109","author":[{"given":"S.","family":"Sunter","sequence":"first","affiliation":[]},{"given":"A.","family":"Roy","sequence":"additional","affiliation":[]},{"given":"J.-F.","family":"Cote","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2003.1271111"},{"key":"ref11","first-page":"632","article-title":"First IC Validation of IEEE Std. 1149.6","author":"vandivier","year":"2003","journal-title":"Proc of ITC"},{"journal-title":"IEEE Standard for Boundary-Scan Testing of Advanced Digital Networks","year":"0","key":"ref12"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2004.38"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2003.818569"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2001.966708"},{"key":"ref3","article-title":"PLL Built-In Self Test Jitter Measurement Integration into 0.18u CMOS Technology","author":"sattler","year":"2001","journal-title":"Proc Test Methods and Reliability of Circuits and Systems Workshop"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/4.823449"},{"key":"ref5","first-page":"380","article-title":"'An On-Chip Short-Time Interval Measurement Technique for Testing High-Speed Communication Links","author":"huang","year":"2001","journal-title":"Proc of VLSI Test Symp"},{"key":"ref8","first-page":"512","article-title":"Challenges in Low Cost Test Approach for ARM9™ Core Based Mixed-Signal SoC DragonBall™-MX1","author":"bao","year":"2003","journal-title":"Proc of ITC"},{"key":"ref7","first-page":"1151","article-title":"Architecting Millisecond Test Solutions for Wireless Phone RFIC's","author":"ferrario","year":"2002","journal-title":"Proc of ITC"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1999.805777"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1049\/el:19750415"},{"key":"ref9","first-page":"518","article-title":"The Value of Tester Accuracy","author":"dalal","year":"1999","journal-title":"Proc of ITC"}],"event":{"name":"International Test Conference 2004","acronym":"TEST-04","location":"Charlotte, NC, USA"},"container-title":["2004 International Conferce on Test"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/9526\/30190\/01386941.pdf?arnumber=1386941","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,14]],"date-time":"2017-03-14T19:04:43Z","timestamp":1489518283000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1386941\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":14,"URL":"https:\/\/doi.org\/10.1109\/test.2004.1386941","relation":{},"subject":[]}}