{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T03:25:51Z","timestamp":1725506751177},"reference-count":16,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/test.2004.1386945","type":"proceedings-article","created":{"date-parts":[[2005,3,21]],"date-time":"2005-03-21T20:07:39Z","timestamp":1111435659000},"page":"134-139","source":"Crossref","is-referenced-by-count":0,"title":["CMOS IC diagnostics using the luminescence of off-state leakage currents"],"prefix":"10.1109","author":[{"given":"S.","family":"Polonsky","sequence":"first","affiliation":[]},{"given":"K.A.","family":"Jenkins","sequence":"additional","affiliation":[]},{"given":"A.","family":"Weger","sequence":"additional","affiliation":[]},{"family":"Shinho Cho","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.2001.955032"},{"key":"ref11","first-page":"655","article-title":"Defect localization using time-resolved photon emission on SOl devices that fail scan tests","author":"bodoh","year":"2002","journal-title":"Proc lSTFA ‘ 2002"},{"key":"ref12","first-page":"387","article-title":"Picosecond imaging circuit analysis of leakage currents in CMOS circuits","author":"polonsky","year":"2002","journal-title":"Proceedings of IST'2002"},{"key":"ref13","first-page":"184","article-title":"A high performance 0.13 µm SOl CMOS technology with Cu interconnects and low-k BEOL dielectric","author":"smeys","year":"2000","journal-title":"Proc Symposium on VLSI Technology"},{"journal-title":"Fundamentals of Modern VLSI Devices","year":"1998","author":"taur","key":"ref14"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2004.825192"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TASC.2003.814178"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1049\/el:19890557"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/S0026-2714(01)00154-8"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/4.701253"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/16.368045"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2001.915045"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/4.953489"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/55.596927"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1063\/1.118305"},{"key":"ref9","first-page":"138","article-title":"Applications of on-chip samplers for test and measurement of integrated circuits","author":"ho","year":"1998","journal-title":"Symposium on VLSl Circuit"}],"event":{"name":"International Test Conference 2004","acronym":"TEST-04","location":"Charlotte, NC, USA"},"container-title":["2004 International Conferce on Test"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/9526\/30190\/01386945.pdf?arnumber=1386945","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,15]],"date-time":"2017-03-15T01:16:01Z","timestamp":1489540561000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1386945\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":16,"URL":"https:\/\/doi.org\/10.1109\/test.2004.1386945","relation":{},"subject":[]}}