{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,3]],"date-time":"2024-09-03T16:47:01Z","timestamp":1725382021133},"reference-count":7,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/test.2004.1386950","type":"proceedings-article","created":{"date-parts":[[2005,3,21]],"date-time":"2005-03-21T20:07:39Z","timestamp":1111435659000},"page":"173-180","source":"Crossref","is-referenced-by-count":0,"title":["Removing JTAG bottlenecks in system interconnect test"],"prefix":"10.1109","author":[{"family":"Hong-Shin Jun","sequence":"first","affiliation":[]},{"given":"S.S.","family":"Chung","sequence":"additional","affiliation":[]},{"given":"S.H.","family":"Baeg","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"journal-title":"Boundary Scan and ASI Test Logic Vision Reference Manual","article-title":"Adding TAP","year":"2002","key":"ref4"},{"key":"ref3","first-page":"641","article-title":"Adapting JTAG for AC Interconnect Testing","author":"whetsel","year":"2003","journal-title":"Proc IEEE International Test Conference"},{"journal-title":"Parallel Optics Based Transmitter\/Receiver 12×2 5Gb\/s Module Cisco Q-Platform Target Specification with specification number ENG-99391","year":"0","key":"ref6"},{"key":"ref5","doi-asserted-by":"crossref","first-page":"30","DOI":"10.1109\/TEST.2001.966615","article-title":"AC-JT AG: Empowering JTAG beyond Testing DC Nets","author":"chung","year":"2001","journal-title":"Proc IEEE International Test Conference"},{"key":"ref7","first-page":"114","article-title":"IBIST Architecture and Methodology for PCI-Express","author":"nejedlo","year":"2003","journal-title":"Proc IEEE International Test Conference"},{"journal-title":"IEEE Standard 1149 6","article-title":"IEEE Standard for Boundary-Scan Testing of Advanced Digital Networks","year":"2003","key":"ref2"},{"journal-title":"IEEE Standard 1149 1–2001","article-title":"IEEE Standard Test Access Port and Boundary-Scan Architecture","year":"2001","key":"ref1"}],"event":{"name":"International Test Conference 2004","acronym":"TEST-04","location":"Charlotte, NC, USA"},"container-title":["2004 International Conferce on Test"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/9526\/30190\/01386950.pdf?arnumber=1386950","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,16]],"date-time":"2017-06-16T17:34:16Z","timestamp":1497634456000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1386950\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":7,"URL":"https:\/\/doi.org\/10.1109\/test.2004.1386950","relation":{},"subject":[]}}