{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T21:33:15Z","timestamp":1725485595960},"reference-count":4,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/test.2004.1386952","type":"proceedings-article","created":{"date-parts":[[2005,3,21]],"date-time":"2005-03-21T20:07:39Z","timestamp":1111435659000},"page":"190-196","source":"Crossref","is-referenced-by-count":5,"title":["Non-deterministic DUT behavior during functional testing of high speed serial busses: challenges and solutions"],"prefix":"10.1109","author":[{"given":"J.","family":"Hops","sequence":"first","affiliation":[]},{"given":"B.","family":"Swing","sequence":"additional","affiliation":[]},{"given":"B.","family":"Phelps","sequence":"additional","affiliation":[]},{"given":"B.","family":"Sudweeks","sequence":"additional","affiliation":[]},{"given":"J.","family":"Pane","sequence":"additional","affiliation":[]},{"given":"J.","family":"Kinslow","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"journal-title":"PCI Express Base Specification Rev 2 1 PCI-SIG","year":"0","key":"ref4"},{"journal-title":"RapidIO® Interconnect Specification Rev 1 1 312001 2001","year":"0","key":"ref3"},{"journal-title":"International Technology Roadmap for Semiconductors 2003 Test and Test Equipment","year":"2003","key":"ref2"},{"journal-title":"International Technology Roadmap for Semiconductors 2003 Executive Summary","year":"2003","key":"ref1"}],"event":{"name":"International Test Conference 2004","acronym":"TEST-04","location":"Charlotte, NC, USA"},"container-title":["2004 International Conferce on Test"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/9526\/30190\/01386952.pdf?arnumber=1386952","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,15]],"date-time":"2017-03-15T00:01:06Z","timestamp":1489536066000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1386952\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":4,"URL":"https:\/\/doi.org\/10.1109\/test.2004.1386952","relation":{},"subject":[]}}