{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,11]],"date-time":"2025-06-11T05:42:58Z","timestamp":1749620578537},"reference-count":15,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/test.2004.1386954","type":"proceedings-article","created":{"date-parts":[[2005,3,21]],"date-time":"2005-03-21T15:07:39Z","timestamp":1111417659000},"page":"203-212","source":"Crossref","is-referenced-by-count":42,"title":["In search of the optimum test set - adaptive test methods for maximum defect coverage and lowest test cost"],"prefix":"10.1109","author":[{"given":"R.","family":"Madge","sequence":"first","affiliation":[]},{"given":"B.","family":"Benware","sequence":"additional","affiliation":[]},{"given":"R.","family":"Turakhia","sequence":"additional","affiliation":[]},{"given":"R.","family":"Daasch","sequence":"additional","affiliation":[]},{"given":"C.","family":"Schuermyer","sequence":"additional","affiliation":[]},{"given":"J.","family":"Ruffler","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","first-page":"326","article-title":"Burn-in failures and local region yield: An integrated Yield-Reliability Model","author":"singh","year":"2001","journal-title":"Proceedings of the VLSI Test Symposium"},{"key":"ref11","first-page":"39","article-title":"Effective Comparisons of Outlier screening Methods for Frequency Dependent Defects","author":"benware","year":"2003","journal-title":"Proceedings of the VLSI Test Symposium"},{"doi-asserted-by":"publisher","key":"ref12","DOI":"10.1109\/TEST.2000.894232"},{"doi-asserted-by":"publisher","key":"ref13","DOI":"10.1109\/TEST.2004.1387326"},{"doi-asserted-by":"publisher","key":"ref14","DOI":"10.1109\/TEST.2004.1387403"},{"doi-asserted-by":"publisher","key":"ref15","DOI":"10.1109\/TEST.2000.894222"},{"doi-asserted-by":"publisher","key":"ref4","DOI":"10.1109\/19.843053"},{"doi-asserted-by":"publisher","key":"ref3","DOI":"10.1109\/19.963168"},{"doi-asserted-by":"publisher","key":"ref6","DOI":"10.1109\/VTEST.2004.1299226"},{"key":"ref5","first-page":"334","article-title":"Adaptive Test scheduling in SOC's by dynamic partitioning","author":"zhao","year":"2002","journal-title":"Proceeding IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems"},{"key":"ref8","first-page":"69","article-title":"Statistical Post Processing at Wafersort","author":"rehani","year":"2002","journal-title":"Proceedings of the VLSI Test Symposium"},{"key":"ref7","first-page":"1240","article-title":"Neighbor Selection for Variance Reduction in IDDQ and Other Parametric Data","author":"daasch","year":"2001","journal-title":"Proceedings of The International Test Conference"},{"doi-asserted-by":"publisher","key":"ref2","DOI":"10.1109\/TEST.2001.966714"},{"doi-asserted-by":"publisher","key":"ref1","DOI":"10.1109\/TEST.2003.1271071"},{"doi-asserted-by":"publisher","key":"ref9","DOI":"10.1109\/TEST.2002.1041819"}],"event":{"acronym":"TEST-04","name":"International Test Conference 2004","location":"Charlotte, NC, USA"},"container-title":["2004 International Conferce on Test"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/9526\/30190\/01386954.pdf?arnumber=1386954","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,14]],"date-time":"2017-03-14T19:43:34Z","timestamp":1489520614000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1386954\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":15,"URL":"https:\/\/doi.org\/10.1109\/test.2004.1386954","relation":{},"subject":[]}}