{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,30]],"date-time":"2025-10-30T22:13:47Z","timestamp":1761862427012,"version":"3.28.0"},"reference-count":10,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/test.2004.1386960","type":"proceedings-article","created":{"date-parts":[[2005,3,21]],"date-time":"2005-03-21T20:07:39Z","timestamp":1111435659000},"page":"262-270","source":"Crossref","is-referenced-by-count":11,"title":["On-chip impulse response generation for analog and mixed-signal testing"],"prefix":"10.1109","author":[{"given":"A.","family":"Singh","sequence":"first","affiliation":[]},{"given":"C.","family":"Patel","sequence":"additional","affiliation":[]},{"given":"J.","family":"Plusquellic","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"ref4","DOI":"10.1109\/ISCAS.1994.409301"},{"key":"ref3","first-page":"183","article-title":"A design-for-test-methodology for active analog filter","author":"soma","year":"1993","journal-title":"IEEE Proceedings of International Test Conference"},{"doi-asserted-by":"publisher","key":"ref10","DOI":"10.1109\/43.662678"},{"doi-asserted-by":"publisher","key":"ref6","DOI":"10.1109\/TEST.1997.639612"},{"key":"ref5","doi-asserted-by":"crossref","DOI":"10.1109\/VTEST.2004.1299257","article-title":"Fault Simulation Model for iDDT Testing: An Investigation","author":"singh","year":"2004","journal-title":"IEEE Proceedings of VLSI Test Symposium"},{"doi-asserted-by":"publisher","key":"ref8","DOI":"10.1109\/ASIC.1992.270219"},{"key":"ref7","first-page":"1","article-title":"A BIST scheme for SNR, gain tracking, and frequency response test of a sigma-delta ADC","volume":"42","author":"toner","year":"1995","journal-title":"IEEE Trans on Computer-Aided Design"},{"key":"ref2","doi-asserted-by":"crossref","first-page":"159","DOI":"10.13182\/NSE61-A28061","article-title":"A crosscorrelation method for measuring the impulse response of reactor systems","volume":"11","author":"balcomb","year":"1961","journal-title":"Nuclear Science and Engineering"},{"key":"ref9","first-page":"4\/1","article-title":"prbs testing of analogue circuits","author":"al-qutayri","year":"1992","journal-title":"Testing Mixed Signal Circuits IEE Colloquium on"},{"doi-asserted-by":"publisher","key":"ref1","DOI":"10.1109\/TAC.1961.1105194"}],"event":{"acronym":"TEST-04","name":"International Test Conference 2004","location":"Charlotte, NC, USA"},"container-title":["2004 International Conferce on Test"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/9526\/30190\/01386960.pdf?arnumber=1386960","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,2,4]],"date-time":"2019-02-04T22:02:24Z","timestamp":1549317744000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1386960\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/test.2004.1386960","relation":{},"subject":[]}}