{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,5,21]],"date-time":"2025-05-21T06:54:39Z","timestamp":1747810479138,"version":"3.28.0"},"reference-count":23,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/test.2004.1386979","type":"proceedings-article","created":{"date-parts":[[2005,3,21]],"date-time":"2005-03-21T20:07:39Z","timestamp":1111435659000},"page":"432-441","source":"Crossref","is-referenced-by-count":56,"title":["X-tolerant signature analysis"],"prefix":"10.1109","author":[{"given":"S.","family":"Mitra","sequence":"first","affiliation":[]},{"given":"S.S.","family":"Lumetta","sequence":"additional","affiliation":[]},{"given":"M.","family":"Mitzenmacher","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2004.823341"},{"key":"ref11","first-page":"1060","article-title":"On-chip Compression of Output Responses with Unknown Values using LFSR Reseeding","author":"m","year":"2003","journal-title":"Proc Intl Test Conf"},{"key":"ref12","first-page":"107","article-title":"Application of Saluja-Kazpovsky Compactors to Test Responses with Many Unknowns","author":"patel","year":"2003","journal-title":"Proc IEEE VLSI Test Symp"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/12.90252"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041773"},{"key":"ref15","first-page":"745","article-title":"Convolutional Compaction of Test Responses","author":"j","year":"2003","journal-title":"Proc Intl Test Conf"},{"key":"ref16","first-page":"83","article-title":"Testing Computer Hardware through Data Compression in Space and Time","author":"saluja","year":"1983","journal-title":"Proc Intl Test Conf"},{"key":"ref17","first-page":"638","article-title":"Simple Bounds on Signature Analysis Aliasing for Random Testing","author":"n r","year":"1992","journal-title":"IEEE Trans Computers"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/12.588057"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2003.1214349"},{"key":"ref4","doi-asserted-by":"crossref","first-page":"452","DOI":"10.1109\/43.703941","article-title":"Zero-aliasing Space Compaction using Linear Compactors with Bounded Overhead","volume":"17","author":"k","year":"1998","journal-title":"IEEE Trans CAD"},{"key":"ref3","first-page":"834","article-title":"Optimal Space Compaction of Test Responses","author":"k","year":"1995","journal-title":"Proc Intl Test Conf"},{"journal-title":"Logic Design Principles with Emphasis on Testable Semicustom Circuits","year":"1986","author":"mccluskey","key":"ref6"},{"journal-title":"Structured Logic Testing","year":"1991","author":"e b","key":"ref5"},{"key":"ref8","first-page":"16","article-title":"ELF-Murphy Data on Defects and Test Sets","author":"e j","year":"2004","journal-title":"Proc IEEE VLSI Test Symp"},{"key":"ref7","doi-asserted-by":"crossref","first-page":"76","DOI":"10.1109\/MDT.2003.1188267","article-title":"Test Compression Roundtable","volume":"20","author":"e j","year":"2003","journal-title":"IEEE Design and Test of Computers"},{"key":"ref2","first-page":"748","article-title":"OPMISR: The Foundation for Compressed ATPG Vectors","author":"c","year":"2001","journal-title":"Proc Intl Test Conf"},{"journal-title":"Built-In Test for VLSI Pseudo-Random Techniques","year":"1987","author":"p h","key":"ref1"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041774"},{"key":"ref20","article-title":"Test Response Compaction for Any Number of Unknowns","author":"volkerink","year":"2003","journal-title":"IEEE Intl Workshop Infrastructure IP"},{"key":"ref22","first-page":"566","article-title":"Efficient Compression and Application of Deterministic Patterns in a Logic BIST Architecture","author":"p","year":"2003","journal-title":"Proc Design Automation Conf"},{"key":"ref21","first-page":"855","article-title":"On Compacting Test Response Data Containing Unknown Values","author":"c","year":"2003","journal-title":"Proc Intl Conf Computer-Aided Design"},{"key":"ref23","first-page":"101","article-title":"Analysis and Design of Optimal Combinational Compactors","author":"wohl","year":"2003","journal-title":"Proc IEEE VLSI Test Symp"}],"event":{"name":"International Test Conference 2004","acronym":"TEST-04","location":"Charlotte, NC, USA"},"container-title":["2004 International Conferce on Test"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/9526\/30190\/01386979.pdf?arnumber=1386979","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,16]],"date-time":"2017-06-16T17:34:14Z","timestamp":1497634454000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1386979\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":23,"URL":"https:\/\/doi.org\/10.1109\/test.2004.1386979","relation":{},"subject":[]}}