{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,8,21]],"date-time":"2025-08-21T17:09:18Z","timestamp":1755796158713},"reference-count":9,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/test.2004.1386992","type":"proceedings-article","created":{"date-parts":[[2005,3,7]],"date-time":"2005-03-07T13:32:27Z","timestamp":1110202347000},"page":"551-559","source":"Crossref","is-referenced-by-count":3,"title":["A frequency mixing and sub-sampling based RF-measurement apparatus for IEEE 1149.4"],"prefix":"10.1109","author":[{"given":"J.","family":"Hakkinen","sequence":"first","affiliation":[]},{"given":"P.","family":"Syri","sequence":"additional","affiliation":[]},{"given":"J.-V.","family":"Voutilainen","sequence":"additional","affiliation":[]},{"given":"M.","family":"Moilanen","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/54.808225"},{"article-title":"Solid State Radio Engineering","year":"1980","author":"krauss","key":"ref3"},{"journal-title":"Mini-circuits","article-title":"LRPS-2–25J Power Splitter","year":"2003","key":"ref6"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2001.966616"},{"journal-title":"Maxim's online data sheets","article-title":"MAX4617, MAX4618, MAX4619 High-Speed, Low-Voltage, CMOS Analog Multiplexers\/Switches","year":"2003","key":"ref8"},{"journal-title":"Mini-circuits","article-title":"MBA-15L Frequency Mixer","year":"2003","key":"ref7"},{"key":"ref2","first-page":"10","article-title":"Some Methods to Calculate the Values of Passive Components from the Measurements Made with an 1149.4 Compliant Device","author":"saikkonen","year":"2003","journal-title":"2nd IEEE International Board Test Workshop"},{"journal-title":"National Semiconductor Advanced Information","article-title":"SCANSTA400 IEEE 1149.4 Analog Test Access Device","year":"2000","key":"ref9"},{"journal-title":"IEEE Std 1149 4-1999","article-title":"Standard for a Mixed Signal Test Bus","year":"2000","key":"ref1"}],"event":{"name":"International Test Conference 2004","acronym":"TEST-04","location":"Charlotte, NC, USA"},"container-title":["2004 International Conferce on Test"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/9526\/30190\/01386992.pdf?arnumber=1386992","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,14]],"date-time":"2017-03-14T19:09:38Z","timestamp":1489518578000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1386992\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":9,"URL":"https:\/\/doi.org\/10.1109\/test.2004.1386992","relation":{},"subject":[]}}