{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T15:39:08Z","timestamp":1725550748356},"reference-count":31,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/test.2004.1386998","type":"proceedings-article","created":{"date-parts":[[2005,3,7]],"date-time":"2005-03-07T13:32:27Z","timestamp":1110202347000},"page":"607-616","source":"Crossref","is-referenced-by-count":0,"title":["Decision selection and learning for an 'all-solutions ATPG engine'"],"prefix":"10.1109","author":[{"given":"K.","family":"Chandrasekar","sequence":"first","affiliation":[]},{"given":"M.S.","family":"Hsiao","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.1992.279312"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/HLDVT.2003.1252484"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TCS.1979.1084687"},{"key":"ref11","first-page":"220","article-title":"PREDICT: Probabilistic estimation of digital circuit Testability","author":"seth","year":"1985","journal-title":"Proc FTCS"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/43.822627"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/12.769433"},{"key":"ref14","first-page":"279","article-title":"Efficient Conflict Driven Learning in a Boolean Satisfiability Solver","author":"zhang","year":"2001","journal-title":"Proc ICCAD"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2003.159706"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.1993.580029"},{"key":"ref17","first-page":"758","article-title":"Variable re-ordering for shared binary decision diagrams using output probabilities","author":"thornton","year":"1999","journal-title":"Proc DATE"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.1995.479994"},{"key":"ref19","first-page":"1690","article-title":"Efficient Varable Ordering Heuristics for Shared ROBDD","author":"chung","year":"1993","journal-title":"Proc ISCAS"},{"key":"ref28","first-page":"446","article-title":"New Techniques for Deterministic Test Pattern Gen","author":"harnzaoglu","year":"1998","journal-title":"Proc VTS"},{"key":"ref4","first-page":"250","article-title":"Applying SAT methods in unbounded symbolic model checking","author":"mcmillan","year":"2002","journal-title":"Proc CAV"},{"key":"ref27","first-page":"705","article-title":"Dynamic Search-Space Pruning Techniques in Path Sensitization","author":"p marques-silva","year":"1994","journal-title":"Proc DAC"},{"key":"ref3","first-page":"272","article-title":"A novel SAT all-solutions solver for efficient preimage computation","author":"li","year":"2004","journal-title":"Proc DATE"},{"key":"ref6","article-title":"On the Development of ATPG based SAT Checker","author":"iyer","year":"2002","journal-title":"Proc MTV"},{"key":"ref29","first-page":"87","article-title":"Conflict driven techniques for improving deterministic test pattern generation","author":"wang","year":"2002","journal-title":"Proc ICCAD"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1145\/775832.776043"},{"article-title":"Digital Systems Testing and Testable Design","year":"1990","author":"abramovici","key":"ref8"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1145\/775832.775947"},{"key":"ref2","first-page":"411","article-title":"Symbolic Reachability Analysis based on SAT-Solvers","author":"abdulla","year":"2000","journal-title":"Proc TACAS"},{"key":"ref9","first-page":"221","article-title":"On Testability of Combinational Networks","author":"brglez","year":"1984","journal-title":"Proc Intl Symp Circuits and Systems"},{"key":"ref1","first-page":"822","article-title":"Efficient Pre-Image Computation Using a Novel Success-Driven ATPG","author":"sheng","year":"2003","journal-title":"Proc DATE"},{"key":"ref20","first-page":"281","article-title":"MINCE: A Static. Glohal Variable-Ordering for SAT and BDD","author":"aloul","year":"2001","journal-title":"IWLS"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/12.324545"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1145\/764825.764839"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/43.3140"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/43.486278"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/43.310903"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1145\/123186.123434"}],"event":{"name":"International Test Conference 2004","acronym":"TEST-04","location":"Charlotte, NC, USA"},"container-title":["2004 International Conferce on Test"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/9526\/30190\/01386998.pdf?arnumber=1386998","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,14]],"date-time":"2017-03-14T20:50:33Z","timestamp":1489524633000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1386998\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":31,"URL":"https:\/\/doi.org\/10.1109\/test.2004.1386998","relation":{},"subject":[]}}