{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,22]],"date-time":"2024-10-22T20:07:38Z","timestamp":1729627658718,"version":"3.28.0"},"reference-count":9,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/test.2004.1387000","type":"proceedings-article","created":{"date-parts":[[2005,3,7]],"date-time":"2005-03-07T18:32:27Z","timestamp":1110220347000},"page":"627-634","source":"Crossref","is-referenced-by-count":6,"title":["Localizing open interconnect defects using targeted routing in FPGA's"],"prefix":"10.1109","author":[{"given":"D.","family":"Mark","sequence":"first","affiliation":[]},{"given":"J.","family":"Fan","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"crossref","first-page":"283","DOI":"10.1109\/ATS.1998.741626","article-title":"Testing and Diagnosis of Interconnect Structures in FPGAs","author":"wang","year":"1998","journal-title":"Proc Seventh Asian Test Symp"},{"key":"ref3","first-page":"283","article-title":"Diagnosing Single Faults for Interconnects in SRAM Based FPGAs","volume":"1","author":"yu","year":"1999","journal-title":"Proceedings of the Design Automation Conference"},{"key":"ref6","first-page":"231","article-title":"A Fast Diagnosis Method for Interconnect Fault in FPGA","volume":"3","author":"wang","year":"2002","journal-title":"The 2002 45th Midwest Symposium on Circuits and Systems"},{"key":"ref5","first-page":"357","article-title":"Minimizing the Number of Programming Steps for Diagnosis of Interconnect Faults in FPGAs","author":"yu","year":"1999","journal-title":"The Eighth Asian Test Symposium"},{"year":"0","journal-title":"XAPP138","article-title":"Virtex Configuration and Readback","key":"ref8"},{"doi-asserted-by":"publisher","key":"ref7","DOI":"10.1109\/TEST.2002.1041811"},{"doi-asserted-by":"publisher","key":"ref2","DOI":"10.1109\/FPT.2002.1188703"},{"year":"0","journal-title":"Virtex-II Pro Platform Users Guide Xilinx Inc","key":"ref9"},{"doi-asserted-by":"publisher","key":"ref1","DOI":"10.1109\/ICMTS.2000.844406"}],"event":{"acronym":"TEST-04","name":"International Test Conference 2004","location":"Charlotte, NC, USA"},"container-title":["2004 International Conferce on Test"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/9526\/30190\/01387000.pdf?arnumber=1387000","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,16]],"date-time":"2017-06-16T16:45:58Z","timestamp":1497631558000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1387000\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":9,"URL":"https:\/\/doi.org\/10.1109\/test.2004.1387000","relation":{},"subject":[]}}