{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T15:11:27Z","timestamp":1730301087776,"version":"3.28.0"},"reference-count":18,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/test.2004.1387347","type":"proceedings-article","created":{"date-parts":[[2005,3,21]],"date-time":"2005-03-21T20:07:39Z","timestamp":1111435659000},"page":"837-846","source":"Crossref","is-referenced-by-count":5,"title":["Built-in self-test for system-on-chip: a case study"],"prefix":"10.1109","author":[{"given":"C.","family":"Stroud","sequence":"first","affiliation":[]},{"given":"J.","family":"Sunwoo","sequence":"additional","affiliation":[]},{"given":"S.","family":"Garimella","sequence":"additional","affiliation":[]},{"given":"J.","family":"Harris","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"journal-title":"A Designer's Guide to Built-In Self-Test","year":"2002","author":"stroud","key":"ref10"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/MTDT.1998.705945"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2002.1004586"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1998.670898"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/43.913755"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2002.1018130"},{"key":"ref16","first-page":"475","article-title":"Functional Testing of Microprocessors","volume":"33","author":"bralune","year":"1984","journal-title":"IEEE Trans on Computers"},{"key":"ref17","first-page":"499","article-title":"Testing a System-on-Chip with Embedded Microprocessor","author":"rajsuman","year":"2003","journal-title":"Proc IEEE Int‘l Test Conf"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/DFTVS.2001.966799"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041813"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/92.920830"},{"key":"ref6","first-page":"83","article-title":"BIST Configurations for Atmel FPGAs Using Macro Generation Language","author":"stroud","year":"2004","journal-title":"Proc IEEE North Atlantic Test Workshop"},{"key":"ref5","first-page":"795","article-title":"Novel Technique for BIST of FPGA Interconnects","author":"sun","year":"2000","journal-title":"Proc IEEE Int‘l Test Conf"},{"key":"ref8","first-page":"1","article-title":"BIST for Xilinx 4000 and publisher-name>Spartan Series FPGAs: A Case Study","author":"stroud","year":"2003","journal-title":"Proc IEEE Int‘l Test Conf"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2003.1271114"},{"journal-title":"Datasheet Atmel Corp","article-title":"AT94K Series Field Programmable System Level Integrated Circuit","year":"2001","key":"ref2"},{"key":"ref1","first-page":"713","article-title":"Using Embedded FPGAs for SoC Yield Improvement","author":"abramovici","year":"2002","journal-title":"Proc ACM\/IEEE Design Automation Conf"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1996.510868"}],"event":{"name":"International Test Conference 2004","acronym":"TEST-04","location":"Charlotte, NC, USA"},"container-title":["2004 International Conferce on Test"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/9526\/30190\/01387347.pdf?arnumber=1387347","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,15]],"date-time":"2017-03-15T03:57:56Z","timestamp":1489550276000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1387347\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":18,"URL":"https:\/\/doi.org\/10.1109\/test.2004.1387347","relation":{},"subject":[]}}