{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,25]],"date-time":"2026-02-25T17:57:39Z","timestamp":1772042259999,"version":"3.50.1"},"reference-count":24,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/test.2004.1387356","type":"proceedings-article","created":{"date-parts":[[2005,3,21]],"date-time":"2005-03-21T20:07:39Z","timestamp":1111435659000},"page":"916-925","source":"Crossref","is-referenced-by-count":67,"title":["VirtualScan: a new compressed scan technology for test cost reduction"],"prefix":"10.1109","author":[{"given":"L.-T.","family":"Wang","sequence":"first","affiliation":[]},{"family":"Xiaoqing Wen","sequence":"additional","affiliation":[]},{"given":"H.","family":"Furukawa","sequence":"additional","affiliation":[]},{"family":"Fei-Sheng Hsu","sequence":"additional","affiliation":[]},{"family":"Shyh-Horng Lin","sequence":"additional","affiliation":[]},{"family":"Sen-Wei Tsai","sequence":"additional","affiliation":[]},{"given":"K.S.","family":"Abdel-Hafez","sequence":"additional","affiliation":[]},{"family":"Shianling Wu","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/12.736428"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.2000.843829"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1145\/378239.378388"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2001.966671"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2001.966696"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041773"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2003.1270902"},{"key":"ref17","doi-asserted-by":"crossref","first-page":"1793","DOI":"10.1109\/43.811328","article-title":"Broadcasting Test Patterns to Multiple Circuits","volume":"18","author":"lee","year":"1999","journal-title":"IEEE Trans on Computer-Aided Design"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/FTCS.1999.781060"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2001.966672"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.1999.810724"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1999.805650"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041755"},{"key":"ref5","first-page":"1088","article-title":"On Static Test Compaction and Test Pattern Ordering for Scan Designs","author":"lin","year":"2001","journal-title":"Proc Int'l Test Conf"},{"key":"ref8","first-page":"237","article-title":"LFSR-Coded Test Patterns for Scan Designs","author":"koenemann","year":"1991","journal-title":"Proc European Test Conf"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1145\/775832.776000"},{"key":"ref2","year":"2003","journal-title":"ITRS Roadmap Test and Test Equipment"},{"key":"ref1","author":"abramovici","year":"1990","journal-title":"Digital Systems Testing and Testable Design"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/12.364534"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2003.1270903"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2003.1270904"},{"key":"ref21","article-title":"Selective Linear Compactor for Test Responses with Unknown Values","author":"rajski","year":"2000"},{"key":"ref24","article-title":"Method and Apparatus for Broadcasting Scan Patterns in a Scan-Based Integrated Circuit","author":"wang","year":"2003"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041774"}],"event":{"name":"International Test Conference 2004","location":"Charlotte, NC, USA","acronym":"TEST-04"},"container-title":["2004 International Conferce on Test"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/9526\/30190\/01387356.pdf?arnumber=1387356","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,16]],"date-time":"2017-06-16T17:34:15Z","timestamp":1497634455000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1387356\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":24,"URL":"https:\/\/doi.org\/10.1109\/test.2004.1387356","relation":{},"subject":[]}}