{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T07:30:08Z","timestamp":1725521408809},"reference-count":7,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/test.2004.1387360","type":"proceedings-article","created":{"date-parts":[[2005,3,21]],"date-time":"2005-03-21T15:07:39Z","timestamp":1111417659000},"page":"953-962","source":"Crossref","is-referenced-by-count":3,"title":["Reducing measurement uncertainty in a DSP-based mixed-signal test environment without increasing test time"],"prefix":"10.1109","author":[{"given":"C.","family":"Taillefer","sequence":"first","affiliation":[]},{"given":"G.W.","family":"Roberts","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","first-page":"166","author":"burns","year":"2001","journal-title":"An Introduction to Mixed-Signal Test and Measurement"},{"journal-title":"Probability random variables and stochastic processes","year":"1991","author":"papoulis","key":"ref3"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1994.528023"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/81.915383"},{"journal-title":"An Improving the Dynamic Measurements of ADC's using the 2-ADC Method Teradyne Users Group","year":"2001","author":"cauvet","key":"ref7"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2001.966743"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/49.761034"}],"event":{"name":"International Test Conference 2004","acronym":"TEST-04","location":"Charlotte, NC, USA"},"container-title":["2004 International Conferce on Test"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/9526\/30190\/01387360.pdf?arnumber=1387360","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,14]],"date-time":"2017-03-14T20:01:10Z","timestamp":1489521670000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1387360\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":7,"URL":"https:\/\/doi.org\/10.1109\/test.2004.1387360","relation":{},"subject":[]}}