{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,29]],"date-time":"2025-09-29T11:51:22Z","timestamp":1759146682612},"reference-count":22,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/test.2004.1387393","type":"proceedings-article","created":{"date-parts":[[2005,3,21]],"date-time":"2005-03-21T20:07:39Z","timestamp":1111435659000},"page":"1203-1212","source":"Crossref","is-referenced-by-count":22,"title":["IEEE P1500-compliant test wrapper design for hierarchical cores"],"prefix":"10.1109","author":[{"given":"A.","family":"Sehgal","sequence":"first","affiliation":[]},{"given":"S.K.","family":"Goel","sequence":"additional","affiliation":[]},{"given":"E.J.","family":"Marinissen","sequence":"additional","affiliation":[]},{"given":"K.","family":"Chakrabarty","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1023\/A:1016589322936"},{"key":"ref11","first-page":"405","article-title":"Core-Clustering Based SOC Test Scheduling Optimization","author":"yu","year":"2002","journal-title":"Proceedings IEEE Asian Test Symposium (ATS)"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1998.743166"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1998.743167"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2003.1271086"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1023\/A:1016545607915"},{"key":"ref16","first-page":"892","article-title":"HD2BIST: A Hierarchical Framework for BIST Scheduling, Data Patterns Delivering and Diagnosis in SoCs","author":"benso","year":"2000","journal-title":"Proceedings IEEE International Test Conference"},{"key":"ref17","first-page":"1.1","article-title":"Test Access Methodology for System-On-Chip Testing","author":"chakraborty","year":"2000","journal-title":"Digest of Papers of IEEE International Workshop on Testing Embedded Core-Based Systems"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1023\/A:1016597624753"},{"key":"ref19","first-page":"299","article-title":"Design and Optimization of Multi-level TAM Architectures for Hierarchical SOCs","author":"vikram","year":"2003","journal-title":"Proceedings IEEE VLSI Test Symposium (VTS)"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/2.769444"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041802"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1023\/A:1016593423844"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041803"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1023\/A:1014916913577"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2000.894302"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2004.1269215"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/54.953269"},{"key":"ref9","first-page":"411","article-title":"Test Scheduling and Test Access Architecture Optimization for System-on-Chip","author":"hsu","year":"2002","journal-title":"Proceedings IEEEAsian Test Symposium"},{"key":"ref20","first-page":"147","article-title":"An Improved Wrapper Architecture for Parallel Testing of Hierarchical Cores","author":"kumar goel","year":"2004","journal-title":"Proceedings IEEE European Test Symposium (ETS)"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1023\/A:1016545607915"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2000.894273"}],"event":{"name":"International Test Conference 2004","acronym":"TEST-04","location":"Charlotte, NC, USA"},"container-title":["2004 International Conferce on Test"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/9526\/30190\/01387393.pdf?arnumber=1387393","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,15]],"date-time":"2017-03-15T00:06:18Z","timestamp":1489536378000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1387393\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":22,"URL":"https:\/\/doi.org\/10.1109\/test.2004.1387393","relation":{},"subject":[]}}