{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T18:05:36Z","timestamp":1725559536980},"reference-count":10,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/test.2004.1387414","type":"proceedings-article","created":{"date-parts":[[2005,3,21]],"date-time":"2005-03-21T15:07:39Z","timestamp":1111417659000},"page":"1389-1397","source":"Crossref","is-referenced-by-count":0,"title":["Performance characterization of mixed-signal circuits using a ternary signal representation"],"prefix":"10.1109","author":[{"family":"Hak-Soo Yu","sequence":"first","affiliation":[]},{"given":"H.","family":"Shin","sequence":"additional","affiliation":[]},{"given":"J.H.","family":"Chun","sequence":"additional","affiliation":[]},{"given":"J.A.","family":"Abraham","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.2000.843851"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/19.779176"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1979.1051299"},{"key":"ref6","first-page":"760","article-title":"An Integration of memory-based analog signal generation into current DFT architectures","author":"hawrysh","year":"1997","journal-title":"Proc IEEE International Test Conference"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2002.998268"},{"journal-title":"DSP-Based Testing of Analog and Mixed-Signal Circuits","year":"1987","author":"mahoney","key":"ref8"},{"journal-title":"Design of Analog CMOS Integrated Circuits","year":"2001","author":"razavi","key":"ref7"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1145\/1119772.1119922"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.1995.523843"},{"key":"ref1","first-page":"307","article-title":"Hybrid Built in Self Test(HBIST) for mixed analoque\/digital ICs","author":"ohletz","year":"1991","journal-title":"Proc European Design and Test Conference"}],"event":{"name":"International Test Conference 2004","acronym":"TEST-04","location":"Charlotte, NC, USA"},"container-title":["2004 International Conferce on Test"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/9526\/30190\/01387414.pdf?arnumber=1387414","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,14]],"date-time":"2017-03-14T21:14:41Z","timestamp":1489526081000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1387414\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/test.2004.1387414","relation":{},"subject":[]}}