{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T00:47:07Z","timestamp":1725410827988},"reference-count":4,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/test.2004.1387442","type":"proceedings-article","created":{"date-parts":[[2005,3,21]],"date-time":"2005-03-21T15:07:39Z","timestamp":1111417659000},"page":"1434","source":"Crossref","is-referenced-by-count":4,"title":["Loopback or not? (loopback testing)"],"prefix":"10.1109","author":[{"given":"T.J.","family":"Yamaguchi","sequence":"first","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041824"},{"journal-title":"PCI ExpressTM Base Specification Revision 1 0a PCI-SIG","year":"2003","key":"ref3"},{"year":"2003","key":"ref2","article-title":"Jitter separation- 50 Mb\/s to over 40 Gb\/s using the Agilent 86100C Infiniium DAC-J"},{"journal-title":"Private Communications","year":"2004","author":"li","key":"ref1"}],"event":{"name":"International Test Conference 2004","acronym":"TEST-04","location":"Charlotte, NC, USA"},"container-title":["2004 International Conferce on Test"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/9526\/30190\/01387442.pdf?arnumber=1387442","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,14]],"date-time":"2017-03-14T21:20:56Z","timestamp":1489526456000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1387442\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":4,"URL":"https:\/\/doi.org\/10.1109\/test.2004.1387442","relation":{},"subject":[]}}