{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T07:53:09Z","timestamp":1725436389144},"reference-count":0,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/test.2004.1387445","type":"proceedings-article","created":{"date-parts":[[2005,3,21]],"date-time":"2005-03-21T15:07:39Z","timestamp":1111417659000},"page":"1437","source":"Crossref","is-referenced-by-count":0,"title":["A little DFT goes a long way when testing multi-Gb\/s I\/O signals"],"prefix":"10.1109","author":[{"given":"J.","family":"Sproch","sequence":"first","affiliation":[]}],"member":"263","event":{"name":"International Test Conference 2004","acronym":"TEST-04","location":"Charlotte, NC, USA"},"container-title":["2004 International Conferce on Test"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/9526\/30190\/01387445.pdf?arnumber=1387445","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,15]],"date-time":"2017-03-15T00:37:10Z","timestamp":1489538230000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1387445\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":0,"URL":"https:\/\/doi.org\/10.1109\/test.2004.1387445","relation":{},"subject":[]}}