{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T16:31:51Z","timestamp":1725467511112},"reference-count":3,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/test.2004.1387448","type":"proceedings-article","created":{"date-parts":[[2005,3,21]],"date-time":"2005-03-21T15:07:39Z","timestamp":1111417659000},"page":"1440","source":"Crossref","is-referenced-by-count":0,"title":["Global failure localization: we have to, but on what and how?"],"prefix":"10.1109","author":[{"given":"E.I.","family":"Cole","sequence":"first","affiliation":[]}],"member":"263","reference":[{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/RELPHY.2003.1197804"},{"key":"ref2","article-title":"Beam-Based Defect Localization Mehtods","author":"cole","year":"2004","journal-title":"The Microelectronics Desk Reference"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1002\/0471728527"}],"event":{"name":"International Test Conference 2004","acronym":"TEST-04","location":"Charlotte, NC, USA"},"container-title":["2004 International Conferce on Test"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/9526\/30190\/01387448.pdf?arnumber=1387448","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,14]],"date-time":"2017-03-14T21:27:41Z","timestamp":1489526861000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1387448\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":3,"URL":"https:\/\/doi.org\/10.1109\/test.2004.1387448","relation":{},"subject":[]}}